Far-infrared investigations of the surface modes in CdS thin films

被引：3

作者：

Trajic, J. ^{[1
]}

Gilic, M. ^{[1
]}

Romcevic, N. ^{[1
]}

Romcevic, M. ^{[1
]}

Stanisic, G. ^{[1
]}

Lazarevic, Z. ^{[1
]}

Joksimovic, D. ^{[3
]}

Yahia, I. S. ^{[2
]}

机构：

[1] Univ Belgrade, Inst Phys, Belgrade, Serbia

[2] Ain Shams Univ, Fac Educ, Dept Phys, Nanosci & Semicond Labs, Cairo, Egypt

[3] Megatrend Univ, Belgrade, Serbia

来源：

PHYSICA SCRIPTA | 2014年 / T162卷

关键词：

CdS thin films; AFM; Raman spectroscopy; far-infrared spectroscopy;

D O I：

10.1088/0031-8949/2014/T162/014031

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The properties of Cadmium sulphide (CdS) thin films were investigated by applying atomic force microscopy (AFM) and far-infrared spectroscopy. CdS thin films were prepared using thermal evaporation technique under a base pressure of 2 x 10(-5) torr. The quality of these films was investigated by AFM spectroscopy. We apply far-infrared spectroscopy to investigate the optical properties of CdS thin films, and reveal the existence of a surface optical phonon (SOP) mode at 297 cm(-1). For the first time, the dielectric function of CdS thin film is modeled as a mixture of homogenous spherical inclusions in air by the Maxwell-Garnet formula. In the analysis of the far-infrared reflection spectra, a numerical model for calculating the reflectivity coefficient for a system which includes films and substrates has been applied.

引用

页数：4

共 20 条

[1]

[Anonymous], T ROYAL SOC LONDON

[2] On the electrical and optical properties of CdS films thermally deposited by a modified source [J].