X-Ray Grating Interferometry for Phase-Contrast Imaging and Optics Metrology Applications

被引：0

作者：

David, Christian ^{[1
]}

Rutishauser, Simon ^{[1
]}

Thuering, Thomas ^{[1
]}

Donath, Tilman ^{[1
]}

Stampanoni, Marco ^{[1
]}

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

来源：

INTERNATIONAL CONFERENCE ON ADVANCED PHASE MEASUREMENT METHODS IN OPTICS AN IMAGING | 2010年 / 1236卷

关键词：

x-ray; phase-contrast;

D O I：

10.1063/1.3426115

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report on a hard x-ray interferometry technique based on diffraction gratings fabricated using microlithography techniques. Compared to other x-ray phase-contrast imaging methods, the grating interferometer only has very moderate requirements in terms of coherence. This makes it possible to use the method with standard x-ray tubes, which opens up a huge range of applications e.g. in medical imaging.

引用

收藏

页码：219 / 219

页数：1

相关论文

共 6 条

[1] Fabrication of diffraction gratings for hard X-ray phase contrast imaging [J].

David, C. ;

Bruder, J. ;

Rohbeck, T. ;

Gruenzweig, C. ;

Kottler, C. ;

Diaz, A. ;

Bunk, O. ;

Pfeiffer, F. .

MICROELECTRONIC ENGINEERING, 2007, 84 (5-8) :1172-1177

[2] Phase-contrast imaging and tomography at 60 keV using a conventional x-ray tube source [J].

Donath, Tilman ;

Pfeiffer, Franz ;

Bunk, Oliver ;

Groot, Waldemar ;

Bednarzik, Martin ;

Gruenzweig, Christian ;

Hempel, Eckhard ;

Popescu, Stefan ;

Hoheisel, Martin ;

David, Christian .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2009, 80 (05)

[3] Hard-X-ray dark-field imaging using a grating interferometer [J].

Pfeiffer, F. ;

Bech, M. ;

Bunk, O. ;

Kraft, P. ;

Eikenberry, E. F. ;

Broennimann, Ch. ;

Gruenzweig, C. ;

David, C. .

NATURE MATERIALS, 2008, 7 (02) :134-137

[4] Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources [J].

Pfeiffer, F ;

Weitkamp, T ;

Bunk, O ;

David, C .

NATURE PHYSICS, 2006, 2 (04) :258-261

[5] X-ray wavefront analysis and optics characterization with a grating interferometer -: art. no. 054101 [J].

Weitkamp, T ;

Nöhammer, B ;

Diaz, A ;

David, C ;

Ziegler, E .

APPLIED PHYSICS LETTERS, 2005, 86 (05) :1-3

[6] X-ray phase imaging with a grating interferometer [J].

Weitkamp, T ;

Diaz, A ;

David, C ;

Pfeiffer, F ;

Stampanoni, M ;

Cloetens, P ;

Ziegler, E .

OPTICS EXPRESS, 2005, 13 (16) :6296-6304