The characterization of Martian meteorite ALH84001 using focused ion beam specimen preparation and transmission electron microscopy

被引：0
作者：
Giannuzzi, LA
Friedmann, EI
机构：
[1] FEI Co, Hillsboro, OR 97124 USA
[2] NASA, Ames Res Ctr, Moffett Field, CA 94035 USA
来源：
GEOCHIMICA ET COSMOCHIMICA ACTA | 2005年 / 69卷 / 10期
关键词：
D O I：
暂无
中图分类号：
P3 [地球物理学]; P59 [地球化学];
学科分类号：
0708 ; 070902 ;
摘要：
引用
收藏
页码：A804 / A804
页数：1
相关论文
共 50 条
[41]   TRANSMISSION ELECTRON-MICROSCOPE SAMPLE PREPARATION USING A FOCUSED ION-BEAM [J].
ISHITANI, T ;
TSUBOI, H ;
YAGUCHI, T ;
KOIKE, H .
JOURNAL OF ELECTRON MICROSCOPY, 1994, 43 (05) :322-326
[42]   Sample preparation by focused ion beam micromachining for transmission electron microscopy imaging in front-view [J].
Jublot, Michael ;
Texier, Michael .
MICRON, 2014, 56 :63-67
[43]   Specimen preparation of porous Au for transmission electron microscopy using cryo ion-milling [J].
Tanabe, Toyokazu .
JOURNAL OF ELECTRON MICROSCOPY, 2011, 60 (01) :35-37
[44]   New specimen preparation methods for materials transmission electron microscopy using ion-milling [J].
JEOL Co Ltd, Tokyo, Japan .
Electron Technol (Warsaw), 2 (183-188)
[45]   Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures [J].
Larson, DJ ;
Foord, DT ;
Petford-Long, AK ;
Cerezo, A ;
Smith, GDW .
NANOTECHNOLOGY, 1999, 10 (01) :45-50
[46]   Side-wall damage in a transmission electron microscopy specimen of crystalline Si prepared by focused ion beam etching [J].
Kato, NI ;
Kohno, Y ;
Saka, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1999, 17 (04) :1201-1204
[47]   Characterization of Dental Bonded Interface Degradation Using Focused Ion Beam and High-Resolution Transmission Electron Microscopy [J].
Duarte, S., Jr. ;
Avishai, A. ;
Sadan, A. .
MICROSCOPY AND MICROANALYSIS, 2009, 15 :368-369
[48]   Transmission electron microscope study of polyphase and discordant monazites: Site-specific specimen preparation using the focused ion beam technique [J].
Seydoux-Guillaume, AM ;
Goncalves, P ;
Wirth, R ;
Deutsch, A .
GEOLOGY, 2003, 31 (11) :973-976
[49]   Transmission electron microscopy sample preparation of tin oxide nanowire sensor using focused ion-beam milling technique [J].
Shukla, S ;
Seal, S ;
Nguyen, P ;
Ng, HT ;
Meyyappan, M .
SENSOR LETTERS, 2003, 1 (01) :75-78
[50]   Field-ion specimen preparation using focused ion-beam milling [J].
Larson, DJ ;
Foord, DT ;
Petford-Long, AK ;
Liew, H ;
Blamire, MG ;
Cerezo, A ;
Smith, GDW .
ULTRAMICROSCOPY, 1999, 79 (1-4) :287-293
12345