ANALYTICAL SERIES X-ray Photoelectron Spectroscopy as an Analysis Tool for Coatings

被引：0

作者：

Haack, Larry ^{[1
]}

机构：

[1] Ford Res & Innovat Ctr, Dearborn, MI 48121 USA

来源：

JCT COATINGSTECH | 2011年 / 8卷 / 02期

关键词：

LOW-ANGLE MICROTOMY; INTERFACE ANALYSIS; EPOXIES; AIR;

D O I：

暂无

中图分类号：

O69 [应用化学];

学科分类号：

081704 ;

摘要：

引用

页码：42 / 51

页数：10

共 19 条

[1] [Anonymous], 1995, Handbook of X-ray Photoelectron Spectroscopy. A Reference Book of Standard Spectra for Identification and Interpretation of XPS Data
[2] FURAR JM, 2005, Patent No. 6960768
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[4] Haack LP, 2000, J COATING TECHNOL, V72, P61
[5] PROPERTIES OF OXIDIZED SILICON AS DETERMINED BY ANGULAR-DEPENDENT X-RAY PHOTOELECTRON-SPECTROSCOPY
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[8] A ToF-SIMS investigation of a buried polymer/polymer interface exposed by ultra-low-angle microtomy
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[J]. SURFACE AND INTERFACE ANALYSIS, 2004, 36 (12) : 1575 - 1581
[9] Interface analysis and compositional depth profiling by XPS of polymer coatings prepared using ultra-low-angle microtomy
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[J]. SURFACE AND INTERFACE ANALYSIS, 2004, 36 (08) : 1032 - 1036
[10] Chemical aging in epoxies: A local study of the interphases to air and to metals
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[J]. JOURNAL OF ADHESION, 2008, 84 (04) : 299 - 321

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