Crosstalk quantification, analysis, and trends in CMOS image sensors

被引：21
作者：
Blockstein, Lior [1 ]
Yadid-Pecht, Orly [2 ]
机构：
[1] Ben Gurion Univ Negev, VLSI Syst Ctr, IL-84105 Beer Sheva, Israel
[2] Univ Calgary, Dept Elect & Comp Engn, Calgary, AB T2N 1N4, Canada
来源：
APPLIED OPTICS | 2010年 / 49卷 / 24期
关键词：
APS CROSSTALK; PHOTORESPONSE ANALYSIS; IMPROVEMENT; MICROLENS;
D O I：
10.1364/AO.49.004483
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Pixel crosstalk (CTK) consists of three components, optical CTK (OCTK), electrical CTK (ECTK), and spectral CTK (SCTK). The CTK has been classified into two groups: pixel-architecture dependent and pixel-architecture independent. The pixel-architecture-dependent CTK (PADC) consists of the sum of two CTK components, i.e., the OCTK and the ECTK. This work presents a short summary of a large variety of methods for PADC reduction. Following that, this work suggests a clear quantifiable definition of PADC. Three complementary metal-oxide-semiconductor (CMOS) image sensors based on different technologies were empirically measured, using a unique scanning technology, the S-cube. The PADC is analyzed, and technology trends are shown. (C) 2010 Optical Society of America
引用
收藏
页码：4483 / 4488
页数：6
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