Crystal structures and X-ray powder diffraction data for Cs2NiSi5O12, RbGaSi2O6, and CsGaSi2O6 synthetic leucite analogues

被引:0
作者
Bell, Anthony M. T. [1 ]
Stone, Alex H. [1 ]
机构
[1] Sheffield Hallam Univ, Mat & Engn Res Inst, Sheffield S1 1WB, S Yorkshire, England
基金
英国工程与自然科学研究理事会;
关键词
powder diffraction; Rietveld refinement; leucite minerals; silicate framework structures; RIETVELD REFINEMENT; PHASE-TRANSITION; DISTANCES; BEHAVIOR; NUCLEAR; PEAK; ZN; NI;
D O I
10.1017/S0885715621000580
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Leucites are tetrahedrally coordinated silicate framework structures with some of the silicon framework cations partially replaced by divalent or trivalent cations. These structures have general formulae A(2)BSi(5)O(12) and ACSi(2)O(6); where A is a monovalent alkali metal cation, B is a divalent cation, and C is a trivalent cation. In this paper, we report the Rietveld refinements of three more synthetic leucite analogues with stoichiometries of Cs2NiSi5O12, RbGaSi2O6, and CsGaSi2O6. Cs2NiSi5O12 is Ia (3) over bard cubic and is isostructural with Cs2CuSi5O12. RbGaSi2O6 is I4(1)/a tetragonal and is isostructural with KGaSi2O6. CsGaSi2O6 is I (4) over bar 3d cubic and is isostructural with RbBSi2O6. (C) The Author(s), 2021. Published by Cambridge University Press on behalf of International Centre for Diffraction Data.
引用
收藏
页码:273 / 281
页数:9
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