Compact Modeling of pH-Sensitive FETs Based on 2-D Semiconductors

被引:8
作者
El Grour, Tarek [1 ]
Pasadas, Francisco [2 ]
Medina-Rull, Alberto [2 ]
Najari, Montassar [3 ]
Marin, Enrique G. [2 ]
Toral-Lopez, Alejandro [2 ]
Ruiz, Francisco G. [2 ]
Godoy, Andres [2 ]
Jimenez, David [4 ]
El Mir, Lassaad [1 ]
机构
[1] Gabes Univ, LAPHYMNE Lab, Gabes, Tunisia
[2] Univ Granada, PEARL Lab, Dept Elect & Tecnol Comp, Granada 18071, Spain
[3] Jazan Univ, Innovat & Entrepreneurship Ctr, Jazan 45142, Saudi Arabia
[4] Univ Autonoma Barcelona, Escola Engn, Dept Engn Elect, Bellaterra 08193, Spain
关键词
Integrated circuit modeling; Sensitivity; Semiconductor device modeling; Threshold voltage; Solid modeling; Logic gates; Field effect transistors; 2-D material; electrolyte; field-effect transistor (FET); ion-sensitive FET (ISFET); pH sensor; transition metal dichalcogenide (TMD); Verilog-A; FIELD-EFFECT TRANSISTORS; LABEL-FREE; ELECTRONIC-STRUCTURE; DOUBLE-LAYER; CHANNEL; NOISE; RES2;
D O I
10.1109/TED.2021.3112407
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present a physics-based circuit-compatible model for pH-sensitive field-effect transistors based on 2-D materials. The electrostatics along the electrolyte-gated 2-D-semiconductor stack is treated by solving the Poisson equation, including the site-binding model and the Gouy-Chapman-Stern approach, while the carrier transport is described by the drift-diffusion theory. The proposed model is provided in an analytical form and then implemented in Verilog-A, making it compatible with standard technology computer-aided design tools employed for circuit simulation. The model is benchmarked against two experimental transition-metal-dichalcogenide (MoS2 and ReS2)-based ion sensors, showing excellent agreement when predicting the drain current, threshold voltage shift, and current/voltage sensitivity measurements for different pH concentrations.
引用
收藏
页码:5916 / 5919
页数:4
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