Estimation of organic molecular film structures using surface-plasmon resonance spectroscopy

被引：12
|
作者：
Zhou, M [1 ]
Otomo, A [1 ]
Yokoyama, S [1 ]
Mashiko, S [1 ]
机构：
[1] Kansai Adv Res Ctr, Commun Res Lab, Nishi Ku, Kobe, Hyogo 6512492, Japan
来源：
THIN SOLID FILMS | 2001年 / 393卷 / 1-2期
关键词：
surface plasmons; infrared spectroscopy; organic substances; Langmuir-Blodgett films;
D O I：
10.1016/S0040-6090(01)01114-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Near-infrared surface-plasmon resonance (SPR) spectroscopy can be used to determine the thickness of single organic molecular films and the permittivities of organic materials with a high degree of sensitivity. The two-wavelength SPR method with one NIR and one visible light probes was used to improve the accuracy of our experiment. Structures of organic molecules on various substrates were investigated. Particular attention was focused on the error in the measuring of thickness, which was caused by the surface roughness of the substrate. The effect of this was determined by ATM observations. The error in measurement caused by a rough substrate was, thus, estimated. (C) 2001 Elsevier Science B.V. All rights reserved.
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页码：114 / 118
页数：5
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