PLASMA COMPOSITION AND SiO2 ETCHING KINETICS IN CF4/C4F8/Ar/He MIXTURE: EFFECTS OF CF4/C4F8 MIXING RATIO AND BIAS POWER

Gas phase characteristics as well as reactive-ion etching kinetics of silicon dioxide in CF4/C4F8/Ar/He plasma with variable CF4/C4F8 mixing ratio and bias potential were investigated under conditions of low (similar to 0.05 W/cm(3)) input power regime. The interest to such regime is due to the possibility to obtain higher etching anisotropy with lower surface damages. The research scheme included plasma diagnostics by Langmuir probes and optical emission spectroscopy in the internal (with no use of standard additives) actinometry approach. It was shown that the substitution of C4F8 for CF4 does not produce sufficient changes in both electrons- and ions-related plasma parameters, but causes a weak increase in fluorine atom density. On the contrary, an increase in the bias power (and thus, in the bias potential) does not disturb plasma composition, but is characterized by proportional changes in the ion bombardment energy. As such, selected variable parameters represent somewhat classical "chemical" and "physical" factors influencing heterogeneous stages of the etching process. It was found that the dominant contribution to the SiO2 etching process belongs to its chemical component while bias powers above 400 W provide no dependence of Si(s.) + xF -> SiFx (where index (s.) points out the particle situated on the surface) reaction probability on the efficiency of ion-induced production of adsorption sites for fluorine atoms, as SiOx(s.) -> Si(s.) + xO. At lower bias powers, the presence of such dependence is confirmed by similar changes of effective reaction probability and ion bombardment intensity, traced by the multiplication of ion flux on square root of ion energy. Some suggestions concerning peculiarities of both gas phase and heterogeneous process kinetics at low plasma densities were made.