共 27 条
Investigation on electrically-driven semiconductor-metal transition of polycrystalline VO2 thin films on two kinds of substrates
被引:10
作者:

Gu, Deen
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Univ Elect Sci & Technol China, Sch Optoelect Informat, Chengdu 610054, Sichuan, Peoples R China Univ Elect Sci & Technol China, Sch Optoelect Informat, Chengdu 610054, Sichuan, Peoples R China

Qin, Haoxin
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Univ Elect Sci & Technol China, Sch Optoelect Informat, Chengdu 610054, Sichuan, Peoples R China Univ Elect Sci & Technol China, Sch Optoelect Informat, Chengdu 610054, Sichuan, Peoples R China

Zhou, Xin
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Univ Elect Sci & Technol China, Sch Optoelect Informat, Chengdu 610054, Sichuan, Peoples R China Univ Elect Sci & Technol China, Sch Optoelect Informat, Chengdu 610054, Sichuan, Peoples R China

Xu, Shiyang
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Univ Elect Sci & Technol China, Sch Optoelect Informat, Chengdu 610054, Sichuan, Peoples R China Univ Elect Sci & Technol China, Sch Optoelect Informat, Chengdu 610054, Sichuan, Peoples R China

Jiang, Yadong
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Univ Elect Sci & Technol China, Sch Optoelect Informat, Chengdu 610054, Sichuan, Peoples R China Univ Elect Sci & Technol China, Sch Optoelect Informat, Chengdu 610054, Sichuan, Peoples R China
机构:
[1] Univ Elect Sci & Technol China, Sch Optoelect Informat, Chengdu 610054, Sichuan, Peoples R China
来源:
基金:
中国国家自然科学基金;
关键词:
INSULATOR-TRANSITION;
D O I:
10.1063/1.4998629
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
Electrical driving is one of frequently-used stimuli for the semiconductor-metal transition (SMT) of VO2. But the driving mechanism is still under debate. We investigated the DC electrically-driven SMT features of polycrystalline VO2 thin films deposited on two kinds of substrates (quartz and silicon) with obviously-different thermal conductivity and the influence of cooling by a thermo electric cooler (TEC) on the SMT of VO2. Interestingly, the SMT doesn't happen at a high voltage at very start, but at a relatively low one. Moreover, the SMT of VO2 thin films on silicon substrate is completely restrained by cooling through a TEC although the electric field strength across VO2 reaches 1.1 x 10(7) V/m. Our findings reveal that the Joule-heating effect plays an important role in the DC electrically-driven SMT of VO2. (c) 2018 Author(s).
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共 27 条
[1]
Thermal conductivity of fused quartz and quartz ceramic at high temperatures and high pressures
[J].
Abdulagatov, IM
;
Emirov, SN
;
Tsomaeva, TA
;
Gairbekov, KA
;
Askerov, SY
;
Magomedova, NA
.
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
2000, 61 (05)
:779-787

Abdulagatov, IM
论文数: 0 引用数: 0
h-index: 0
机构:
Russian Acad Sci, Dagestan Sci Ctr, Inst Geothermal Res, Makhachkala 367030, Dagestan, Russia Russian Acad Sci, Dagestan Sci Ctr, Inst Geothermal Res, Makhachkala 367030, Dagestan, Russia

Emirov, SN
论文数: 0 引用数: 0
h-index: 0
机构:
Russian Acad Sci, Dagestan Sci Ctr, Inst Geothermal Res, Makhachkala 367030, Dagestan, Russia Russian Acad Sci, Dagestan Sci Ctr, Inst Geothermal Res, Makhachkala 367030, Dagestan, Russia

Tsomaeva, TA
论文数: 0 引用数: 0
h-index: 0
机构:
Russian Acad Sci, Dagestan Sci Ctr, Inst Geothermal Res, Makhachkala 367030, Dagestan, Russia Russian Acad Sci, Dagestan Sci Ctr, Inst Geothermal Res, Makhachkala 367030, Dagestan, Russia

Gairbekov, KA
论文数: 0 引用数: 0
h-index: 0
机构:
Russian Acad Sci, Dagestan Sci Ctr, Inst Geothermal Res, Makhachkala 367030, Dagestan, Russia Russian Acad Sci, Dagestan Sci Ctr, Inst Geothermal Res, Makhachkala 367030, Dagestan, Russia

Askerov, SY
论文数: 0 引用数: 0
h-index: 0
机构:
Russian Acad Sci, Dagestan Sci Ctr, Inst Geothermal Res, Makhachkala 367030, Dagestan, Russia Russian Acad Sci, Dagestan Sci Ctr, Inst Geothermal Res, Makhachkala 367030, Dagestan, Russia

Magomedova, NA
论文数: 0 引用数: 0
h-index: 0
机构:
Russian Acad Sci, Dagestan Sci Ctr, Inst Geothermal Res, Makhachkala 367030, Dagestan, Russia Russian Acad Sci, Dagestan Sci Ctr, Inst Geothermal Res, Makhachkala 367030, Dagestan, Russia
[2]
Grain size effect on the semiconductor-metal phase transition characteristics of magnetron-sputtered VO2 thin films -: art. no. 051910
[J].
Brassard, D
;
Fourmaux, S
;
Jean-Jacques, M
;
Kieffer, JC
;
El Khakani, MA
.
APPLIED PHYSICS LETTERS,
2005, 87 (05)

Brassard, D
论文数: 0 引用数: 0
h-index: 0
机构:
INRS Energie Mat & Telecommun, Varennes, PQ J3X 1S2, Canada INRS Energie Mat & Telecommun, Varennes, PQ J3X 1S2, Canada

Fourmaux, S
论文数: 0 引用数: 0
h-index: 0
机构:
INRS Energie Mat & Telecommun, Varennes, PQ J3X 1S2, Canada INRS Energie Mat & Telecommun, Varennes, PQ J3X 1S2, Canada

Jean-Jacques, M
论文数: 0 引用数: 0
h-index: 0
机构:
INRS Energie Mat & Telecommun, Varennes, PQ J3X 1S2, Canada INRS Energie Mat & Telecommun, Varennes, PQ J3X 1S2, Canada

Kieffer, JC
论文数: 0 引用数: 0
h-index: 0
机构:
INRS Energie Mat & Telecommun, Varennes, PQ J3X 1S2, Canada INRS Energie Mat & Telecommun, Varennes, PQ J3X 1S2, Canada

El Khakani, MA
论文数: 0 引用数: 0
h-index: 0
机构:
INRS Energie Mat & Telecommun, Varennes, PQ J3X 1S2, Canada INRS Energie Mat & Telecommun, Varennes, PQ J3X 1S2, Canada
[3]
Thermal conductivity of (VO2)1-xCux composites across the phase transition temperature
[J].
Dahal, Keshab
;
Zhang, Qian
;
He, Ran
;
Mishra, Ishwar Kumar
;
Ren, Zhifeng
.
JOURNAL OF APPLIED PHYSICS,
2017, 121 (15)

Dahal, Keshab
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Houston, Dept Phys, Houston, TX 77204 USA
Univ Houston, TcSUH, Houston, TX 77204 USA Univ Houston, Dept Phys, Houston, TX 77204 USA

Zhang, Qian
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Houston, Dept Phys, Houston, TX 77204 USA
Univ Houston, TcSUH, Houston, TX 77204 USA
Harbin Inst Technol, Dept Mat Sci & Engn, Shenzhen 518055, Guangdong, Peoples R China Univ Houston, Dept Phys, Houston, TX 77204 USA

He, Ran
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Houston, Dept Phys, Houston, TX 77204 USA
Univ Houston, TcSUH, Houston, TX 77204 USA Univ Houston, Dept Phys, Houston, TX 77204 USA

Mishra, Ishwar Kumar
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Houston, Dept Phys, Houston, TX 77204 USA
Univ Houston, TcSUH, Houston, TX 77204 USA Univ Houston, Dept Phys, Houston, TX 77204 USA

Ren, Zhifeng
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Houston, Dept Phys, Houston, TX 77204 USA
Univ Houston, TcSUH, Houston, TX 77204 USA Univ Houston, Dept Phys, Houston, TX 77204 USA
[4]
Ultrafast Nanoimaging of the Photoinduced Phase Transition Dynamics in VO2
[J].
Donges, Sven A.
;
Khatib, Omar
;
O'Callahan, Brian T.
;
Atkin, Joanna M.
;
Park, Jae Hyung
;
Cobden, David
;
Raschke, Markus B.
.
NANO LETTERS,
2016, 16 (05)
:3029-3035

Donges, Sven A.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Colorado, Dept Chem, Dept Phys, Boulder, CO 80309 USA
Univ Colorado, JILA, Boulder, CO 80309 USA Univ Colorado, Dept Chem, Dept Phys, Boulder, CO 80309 USA

Khatib, Omar
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Colorado, Dept Chem, Dept Phys, Boulder, CO 80309 USA
Univ Colorado, JILA, Boulder, CO 80309 USA Univ Colorado, Dept Chem, Dept Phys, Boulder, CO 80309 USA

O'Callahan, Brian T.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Colorado, Dept Chem, Dept Phys, Boulder, CO 80309 USA
Univ Colorado, JILA, Boulder, CO 80309 USA Univ Colorado, Dept Chem, Dept Phys, Boulder, CO 80309 USA

Atkin, Joanna M.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ N Carolina, Dept Chem, Chapel Hill, NC 27514 USA Univ Colorado, Dept Chem, Dept Phys, Boulder, CO 80309 USA

Park, Jae Hyung
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Washington, Dept Phys, Seattle, WA 98195 USA Univ Colorado, Dept Chem, Dept Phys, Boulder, CO 80309 USA

论文数: 引用数:
h-index:
机构:

Raschke, Markus B.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Colorado, Dept Chem, Dept Phys, Boulder, CO 80309 USA
Univ Colorado, JILA, Boulder, CO 80309 USA Univ Colorado, Dept Chem, Dept Phys, Boulder, CO 80309 USA
[5]
Current oscillations in vanadium dioxide: Evidence for electrically triggered percolation avalanches
[J].
Driscoll, Tom
;
Quinn, Jack
;
Di Ventra, Massimiliano
;
Basov, Dimitri N.
;
Seo, Giwan
;
Lee, Yong-Wook
;
Kim, Hyun-Tak
;
Smith, David R.
.
PHYSICAL REVIEW B,
2012, 86 (09)

Driscoll, Tom
论文数: 0 引用数: 0
h-index: 0
机构:
Duke Univ, Ctr Metamat & Integrated Plasmon, Pratt Sch Engn, Durham, NC 27708 USA
Univ Calif San Diego, Dept Phys, La Jolla, CA 92093 USA Duke Univ, Ctr Metamat & Integrated Plasmon, Pratt Sch Engn, Durham, NC 27708 USA

Quinn, Jack
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif San Diego, Dept Phys, La Jolla, CA 92093 USA Duke Univ, Ctr Metamat & Integrated Plasmon, Pratt Sch Engn, Durham, NC 27708 USA

Di Ventra, Massimiliano
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif San Diego, Dept Phys, La Jolla, CA 92093 USA Duke Univ, Ctr Metamat & Integrated Plasmon, Pratt Sch Engn, Durham, NC 27708 USA

Basov, Dimitri N.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif San Diego, Dept Phys, La Jolla, CA 92093 USA Duke Univ, Ctr Metamat & Integrated Plasmon, Pratt Sch Engn, Durham, NC 27708 USA

论文数: 引用数:
h-index:
机构:

Lee, Yong-Wook
论文数: 0 引用数: 0
h-index: 0
机构:
Pukyong Natl Univ, Sch Elect Engn, Pusan 608737, South Korea Duke Univ, Ctr Metamat & Integrated Plasmon, Pratt Sch Engn, Durham, NC 27708 USA

Kim, Hyun-Tak
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Sci & Technol UST, Sch Adv Device Technol, Taejon 305350, South Korea
ETRI, Creat Res Ctr Met Insulator Transit, Taejon 305700, South Korea Duke Univ, Ctr Metamat & Integrated Plasmon, Pratt Sch Engn, Durham, NC 27708 USA

Smith, David R.
论文数: 0 引用数: 0
h-index: 0
机构:
Duke Univ, Ctr Metamat & Integrated Plasmon, Pratt Sch Engn, Durham, NC 27708 USA Duke Univ, Ctr Metamat & Integrated Plasmon, Pratt Sch Engn, Durham, NC 27708 USA
[6]
Effects of Annealing Parameters on Optical Properties of Thermochromic VO2 Films Prepared in Aqueous Solution
[J].
Kang, Litao
;
Gao, Yanfeng
;
Zhang, Zongtao
;
Du, Jing
;
Cao, Chuanxiang
;
Chen, Zhang
;
Luo, Hongjie
.
JOURNAL OF PHYSICAL CHEMISTRY C,
2010, 114 (04)
:1901-1911

Kang, Litao
论文数: 0 引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Shanghai Inst Ceram, Res Ctr Ind Ceram, Shanghai 200050, Peoples R China
Chinese Acad Sci, Grad Univ, Beijing 100049, Peoples R China Chinese Acad Sci, Shanghai Inst Ceram, Res Ctr Ind Ceram, Shanghai 200050, Peoples R China

Gao, Yanfeng
论文数: 0 引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Shanghai Inst Ceram, Res Ctr Ind Ceram, Shanghai 200050, Peoples R China Chinese Acad Sci, Shanghai Inst Ceram, Res Ctr Ind Ceram, Shanghai 200050, Peoples R China

Zhang, Zongtao
论文数: 0 引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Shanghai Inst Ceram, Res Ctr Ind Ceram, Shanghai 200050, Peoples R China
Chinese Acad Sci, Grad Univ, Beijing 100049, Peoples R China Chinese Acad Sci, Shanghai Inst Ceram, Res Ctr Ind Ceram, Shanghai 200050, Peoples R China

Du, Jing
论文数: 0 引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Shanghai Inst Ceram, Res Ctr Ind Ceram, Shanghai 200050, Peoples R China
Chinese Acad Sci, Grad Univ, Beijing 100049, Peoples R China Chinese Acad Sci, Shanghai Inst Ceram, Res Ctr Ind Ceram, Shanghai 200050, Peoples R China

Cao, Chuanxiang
论文数: 0 引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Shanghai Inst Ceram, Res Ctr Ind Ceram, Shanghai 200050, Peoples R China
Chinese Acad Sci, Grad Univ, Beijing 100049, Peoples R China Chinese Acad Sci, Shanghai Inst Ceram, Res Ctr Ind Ceram, Shanghai 200050, Peoples R China

Chen, Zhang
论文数: 0 引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Shanghai Inst Ceram, Res Ctr Ind Ceram, Shanghai 200050, Peoples R China
Shaanxi Univ Sci & Technol, Sch Mat Sci & Engn, Xian 710021, Peoples R China Chinese Acad Sci, Shanghai Inst Ceram, Res Ctr Ind Ceram, Shanghai 200050, Peoples R China

Luo, Hongjie
论文数: 0 引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Shanghai Inst Ceram, Res Ctr Ind Ceram, Shanghai 200050, Peoples R China Chinese Acad Sci, Shanghai Inst Ceram, Res Ctr Ind Ceram, Shanghai 200050, Peoples R China
[7]
Temperature dependence of the first-order metal-insulator transition in VO2 and programmable critical temperature sensor
[J].
Kim, Bong-Jun
;
Lee, Yong Wook
;
Chae, Byung-Gyu
;
Yun, Sun Jin
;
Oh, Soo-Young
;
Kim, Hyun-Tak
;
Lim, Yong-Sik
.
APPLIED PHYSICS LETTERS,
2007, 90 (02)

Kim, Bong-Jun
论文数: 0 引用数: 0
h-index: 0
机构:
ETRI, IT Convergence & Components Lab, Taejon 305350, South Korea ETRI, IT Convergence & Components Lab, Taejon 305350, South Korea

Lee, Yong Wook
论文数: 0 引用数: 0
h-index: 0
机构: ETRI, IT Convergence & Components Lab, Taejon 305350, South Korea

Chae, Byung-Gyu
论文数: 0 引用数: 0
h-index: 0
机构: ETRI, IT Convergence & Components Lab, Taejon 305350, South Korea

Yun, Sun Jin
论文数: 0 引用数: 0
h-index: 0
机构: ETRI, IT Convergence & Components Lab, Taejon 305350, South Korea

Oh, Soo-Young
论文数: 0 引用数: 0
h-index: 0
机构: ETRI, IT Convergence & Components Lab, Taejon 305350, South Korea

Kim, Hyun-Tak
论文数: 0 引用数: 0
h-index: 0
机构: ETRI, IT Convergence & Components Lab, Taejon 305350, South Korea

Lim, Yong-Sik
论文数: 0 引用数: 0
h-index: 0
机构: ETRI, IT Convergence & Components Lab, Taejon 305350, South Korea
[8]
Raman study of electric-field-induced first-order metal-insulator transition in VO2-based devices -: art. no. 242101
[J].
Kim, HT
;
Chae, BG
;
Youn, DH
;
Kim, G
;
Kang, KY
;
Lee, SJ
;
Kim, K
;
Lim, YS
.
APPLIED PHYSICS LETTERS,
2005, 86 (24)
:1-3

Kim, HT
论文数: 0 引用数: 0
h-index: 0
机构:
Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea

Chae, BG
论文数: 0 引用数: 0
h-index: 0
机构: Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea

Youn, DH
论文数: 0 引用数: 0
h-index: 0
机构: Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea

Kim, G
论文数: 0 引用数: 0
h-index: 0
机构: Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea

Kang, KY
论文数: 0 引用数: 0
h-index: 0
机构: Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea

Lee, SJ
论文数: 0 引用数: 0
h-index: 0
机构: Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea

Kim, K
论文数: 0 引用数: 0
h-index: 0
机构: Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea

Lim, YS
论文数: 0 引用数: 0
h-index: 0
机构: Elect & Telecommun Res Inst, Basic Res Lab, Taejon 305350, South Korea
[9]
Local Temperature Redistribution and Structural Transition During Joule-Heating-Driven Conductance Switching in VO2
[J].
Kumar, Suhas
;
Pickett, Matthew D.
;
Strachan, John Paul
;
Gibson, Gary
;
Nishi, Yoshio
;
Williams, R. Stanley
.
ADVANCED MATERIALS,
2013, 25 (42)
:6128-6132

Kumar, Suhas
论文数: 0 引用数: 0
h-index: 0
机构:
Hewlett Packard Labs, Palo Alto, CA 94304 USA
Stanford Univ, Stanford, CA 94305 USA Hewlett Packard Labs, Palo Alto, CA 94304 USA

Pickett, Matthew D.
论文数: 0 引用数: 0
h-index: 0
机构:
Hewlett Packard Labs, Palo Alto, CA 94304 USA Hewlett Packard Labs, Palo Alto, CA 94304 USA

Strachan, John Paul
论文数: 0 引用数: 0
h-index: 0
机构:
Hewlett Packard Labs, Palo Alto, CA 94304 USA Hewlett Packard Labs, Palo Alto, CA 94304 USA

Gibson, Gary
论文数: 0 引用数: 0
h-index: 0
机构:
Hewlett Packard Labs, Palo Alto, CA 94304 USA Hewlett Packard Labs, Palo Alto, CA 94304 USA

Nishi, Yoshio
论文数: 0 引用数: 0
h-index: 0
机构:
Stanford Univ, Stanford, CA 94305 USA Hewlett Packard Labs, Palo Alto, CA 94304 USA

Williams, R. Stanley
论文数: 0 引用数: 0
h-index: 0
机构:
Hewlett Packard Labs, Palo Alto, CA 94304 USA Hewlett Packard Labs, Palo Alto, CA 94304 USA
[10]
Ultrasensitive mass balance based on a bulk acoustic mode single-crystal silicon resonator
[J].
Lee, J. E. -Y.
;
Bahreyni, B.
;
Zhu, Y.
;
Seshia, A. A.
.
APPLIED PHYSICS LETTERS,
2007, 91 (23)

Lee, J. E. -Y.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England

Bahreyni, B.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England

Zhu, Y.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England

Seshia, A. A.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England