Suppressing the growth of interfacial Cu-Sn intermetallic compounds in the Sn-3.0Ag-0.5Cu-0.1Ni/Cu-15Zn solder joint during thermal aging

被引：25
作者：
Chen, Wei-Yu [1 ]
Yu, Chi-Yang [1 ]
Duh, Jenq-Gong [1 ]
机构：
[1] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 30013, Taiwan
来源：
JOURNAL OF MATERIALS SCIENCE | 2012年 / 47卷 / 09期
关键词：
LEAD-FREE SOLDERS; AG-CU; ZN; REFLOW;
D O I：
10.1007/s10853-012-6254-0
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Evolution of interfacial phase formation in Sn-3.0 Ag-0.5Cu/Cu (wt%), Sn-3.0Ag-0.5Cu-0.1Ni/Cu, Sn-3.0 Ag-0.5Cu/Cu-15Zn, and Sn-3.0Ag-0.5Cu-0.1Ni/Cu-15Zn solder joints are investigated. Doping Ni in the solder joint can suppress the growth of Cu3Sn and alter the morphology of the interfacial intermetallic compounds (IMCs), however it shows rapid growth of (Cu,Ni)(6)Sn-5 at the Sn-3.0Ag-0.5Cu-0.1Ni/Cu interface. In comparison with the Cu substrates, the Cu-Zn substrates effectively suppress the formation of Cu-Sn IMCs. Among these four solder joints, the Sn-3.0Ag-0.5Cu-0.1Ni/Cu-15Zn solder joint exhibits the thinnest IMC, and only (Cu,Ni)(6)(Sn,Zn)(5) formed at the interface after aging. It is revealed that the presence of Ni acts to enhance the effect of Zn on the suppression of Cu-Sn IMCs in the SAC305-0.1Ni/Cu-15Zn solder joint. The limited formation of IMCs is related to the elemental redistribution at the joint interfaces during aging. The Sn-3.0Ag-0.5Cu-0.1Ni/Cu-15Zn joint can act as a stabilized interconnection due to the effective suppression of interfacial reaction.
引用
收藏
页码：4012 / 4018
页数：7
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