Molecular dynamics modeling of the effect of thermal interface material on thermal contact conductance

被引:0
|
作者
Jayadeep, U. B. [1 ]
Sabareesh, R. Krishna [1 ]
Nirmal, R. [1 ]
Rijin, K. V. [1 ]
Sobhan, C. B. [1 ]
机构
[1] Natl Inst Technol, Nanotechnol Res Lab, Calicut 673601, Kerala, India
来源
PROCEEDINGS OF THE MICRO/NANOSCALE HEAT TRANSFER INTERNATIONAL CONFERENCE 2008, PTS A AND B | 2008年
关键词
thermal contact modeling; thermal interface material; molecular dynamics; nanoscale conduction;
D O I
暂无
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Thermal contact conductance is used to indicate the resistance offered by a contact interface to the flow of heat. When an interface material is applied as nano-layered coatings on super-finished contacting surfaces, the possibility of size effects necessitates the use of a discrete computation method for its analysis. Hence, a methodology is proposed which utilizes Molecular Dynamics (MD) simulations to obtain the size affected thermal conductivity of the interfacial layer, which in turn characterizes the thermal contact conductance behavior. Molecular Dynamics codes have been developed, making use of Sutton-Chen many-body potential, suitable for metallic materials. The model includes the asperities at the contact interface, assuming the asperities to be of a simplified geometry. The paper also presents the validation of the codes developed, and parametric studies on the effect of temperature, number of asperities and the material used for thermal interface coating on the size-affected interfacial conductivity.
引用
收藏
页码:1351 / 1355
页数:5
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