Experimental determination of electron inelastic mean free path of components in a magnetic read head

被引:0
作者
Xu, X. [1 ]
Vinh, L. [1 ]
Risner-Jamtgaard, J. [1 ]
Yaney, D. [1 ]
机构
[1] Hitachi Global Storage Technol Inc, San Jose, CA 95193 USA
关键词
D O I
10.1017/S1431927609093611
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
[No abstract available]
引用
收藏
页码:326 / 327
页数:2
相关论文
共 3 条
  • [1] [Anonymous], 2009, Transmission Electron Microscopy: A Textbook for Materials Science
  • [2] Egerton R.F., 1996, ELECT ENERGY LOSS SP
  • [3] Egerton R. F., 1987, ULTRAMICROSCOPY