High-precision angular measurement of 12C ion interaction using a new imaging method with a CR-39 detector in the energy range below 100 MeV/nucleon

In this study, we show that angular measurement of nuclear tracks produced in heavy ion interactions can be made with high precision using a CR-39 solid-state nuclear track detector. For this purpose, we have increased the position resolution of nuclear track (etch pit) analysis and the precission of thickness measurement of the CR-39 detector. The position resolution of the heavy ion track was verified to be 0.02 pm by the dedicated image analysis software package PitFit. The precision of the thickness measurement of the CR-39 detector was increased to 0.6 mu m by our new both sides imaging method of the CR-39 detector using the autofocus system of the microscope. As a consequence, the angular distributions of projectiles and fragments can be realized with a precision of 1.4 x 10(-2) degrees (2.5 x 10(-4) radian). As a demonstration, we applied the angular measurement technique to the diagnosis of heavy ion beam and the small Coulomb scattering angle measurement of interactions of C-12 + Al in energies below 100 MeV/nucleon. By this new imaging technique, event-by-event interaction of the projectiles in the CR-39 detector can be measured rapidly and can be applied to the measurement of the total charge-changing cross section, the decay mode, and the branching ratios of the projectile with higher angular precision.