The variation of the enhanced photoluminescence efficiency of Y2O3:Eu3+ films with the thickness to the photonic crystal layer

被引：17
作者：
Ko, Ki-Young [1 ]
Lee, Young Kwang [1 ]
Park, Hoo Keun [1 ]
Kim, Yoon-Chang [2 ]
Do, Young Rag [1 ]
机构：
[1] Kookmin Univ, Dept Chem, Seoul 136702, South Korea
[2] Samsung SDI Co Ltd, Res & Dev Ctr, Kyeonggi Do 449902, South Korea
来源：
OPTICS EXPRESS | 2008年 / 16卷 / 08期
关键词：
D O I：
10.1364/OE.16.005689
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
This study examined the effects of the thickness of Y2O3:Eu3+ phosphor films on quartz substrates coated with two-dimensional (2D) SiO2 square-lattice nanorod photonic crystal layers (PCL) at identical heights on their extraction and absorption efficiency. The photoluminescence (PL) efficiency enhancement ratio decreased exponentially with increasing Y2O3:Eu3+ film thickness. The 2D PCL-assisted Y2O3:Eu3+ film with a thickness (t) = 400 nm showed enhancement in the upward and downward PL emission by factors of 6.2 and 8.6, respectively, with respect to those of a conventional flat film. This observation was attributed to diffraction scattering of the excitation and emission light. (C) 2008 Optical Society of America.
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收藏
页码：5689 / 5696
页数：8
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