Sub-nano resolution fiber-optic static strain sensor using a sideband interrogation technique

被引：47

作者：

Liu, Qingwen ^{[1
]}

Tokunaga, Tomochika ^{[2
]}

He, Zuyuan ^{[1
]}

机构：

[1] Univ Tokyo, Dept Elect Engn & Informat Syst, Bunkyo Ku, Tokyo 1138656, Japan

[2] Univ Tokyo, Dept Environm Syst, Kashiwa, Chiba 2778563, Japan

来源：

OPTICS LETTERS | 2012年 / 37卷 / 03期

基金：

日本科学技术振兴机构; 日本学术振兴会;

关键词：

BRAGG GRATINGS; LASERS;

D O I：

10.1364/OL.37.000434

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We propose a novel sideband interrogation technique with multiplex radio frequency intensity and phase modulation to measure the resonance frequency difference between two optical resonators. Based on this new technique, an ultrahighly sensitive fiber-optic static strain sensor system consisting of a pair of identical fiber Fabry-Perot interferometers is built by incorporating a cross-correlation data processing algorithm. A static strain resolution down to 0.8 ne is demonstrated experimentally, which makes the sensor system a useful tool for geophysical research applications. (C) 2012 Optical Society of America

引用

页码：434 / 436

页数：3

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