Simultaneous measurement of X-ray diffraction and ferroelectric polarization data as a function of applied electric field and frequency

被引:18
|
作者
Wooldridge, Jenny [1 ]
Ryding, Steph [2 ]
Brown, Simon [3 ,4 ]
Burnett, Tim L. [1 ]
Cain, Markys G. [1 ]
Cernik, Robert [2 ]
Hino, Ricardo
Stewart, Mark [1 ]
Thompson, Paul [3 ,4 ]
机构
[1] Natl Phys Lab, Teddington TW11 0LW, Middx, England
[2] Manchester Mat Sci Ctr, Manchester M13 9PL, Lancs, England
[3] ESRF, XMaS, UK CRG, F-38043 Grenoble, France
[4] Univ Liverpool, Liverpool L69 3BX, Merseyside, England
基金
英国工程与自然科学研究理事会;
关键词
ferroelectric; polarization; dynamic; in situ; X-ray diffraction; HIGH-RESOLUTION DIFFRACTION; SINGLE-CRYSTALS; RELAXOR FERROELECTRICS; PERFORMANCE; BEAMLINE; BEHAVIOR; ESRF;
D O I
10.1107/S0909049512025782
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The characteristics of a new ferroelectric measurement system at the European Synchrotron Radiation Facility are presented. The electric-field-induced phase transitions of Pb(Mg1/3Nb2/3)O-3-xPbTiO(3) are determined via in situ measurements of electric polarization within the synchrotron diffraction beamline. Real-time data collection methods on single-crystal samples are employed as a function of frequency to determine the microstructural origin of piezoelectric effects within these materials, probing the dynamic ferroelectric response.
引用
收藏
页码:710 / 716
页数:7
相关论文
共 50 条
  • [31] X-ray linear dichroism dependence on ferroelectric polarization
    Polisetty, S.
    Zhou, J.
    Karthik, J.
    Damodaran, A. R.
    Chen, D.
    Scholl, A.
    Martin, L. W.
    Holcomb, M.
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2012, 24 (24)
  • [32] X-ray diffraction study of chemical bonds under external electric field
    Gorfman, Semen
    Schmidt, Oleg
    Schmidt, Marcus
    Borrmann, Horst
    Grin, Yuri
    Tsirelson, Vladimir
    Pietsch, Ullrich
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2006, 62 : S171 - S171
  • [33] Time-resolved x-ray diffraction study of the piezoelectric crystal response to a fast change of an applied electric field
    Gorfman, Semen
    Schmidt, Oleg
    Ziolkowski, Michael
    von Kozierowski, Marc
    Pietsch, Ullrich
    JOURNAL OF APPLIED PHYSICS, 2010, 108 (06)
  • [34] X-ray diffraction by a crystal in a permanent external electric field: general considerations
    Gorfman, SV
    Tsirelson, VG
    Pietsch, U
    ACTA CRYSTALLOGRAPHICA SECTION A, 2005, 61 : 387 - 396
  • [35] X-RAY DIFFRACTION DATA FOR TAENIOLITE
    LALONDE, RE
    AMERICAN MINERALOGIST, 1963, 48 (1-2) : 204 - &
  • [36] X-RAY DIFFRACTION DATA OF ALUMINOCOPIAPITE
    JOLLY, JH
    FOSTER, HL
    AMERICAN MINERALOGIST, 1967, 52 (7-8) : 1220 - &
  • [37] Position and electric field dependent local lattice strain detected by nanobeam x-ray diffraction on a relaxor ferroelectric single crystal
    Aoyagi, Shinobu
    Aoyagi, Ayumi
    Takeda, Hiroaki
    Osawa, Hitoshi
    Sumitani, Kazushi
    Imai, Yasuhiko
    Kimura, Shigeru
    PHYSICAL REVIEW B, 2022, 105 (02)
  • [38] INFLUENCE OF X-RAY POLARIZATION ON VISIBILITY OF PENDELLOSUNG FRINGES IN X-RAY DIFFRACTION TOPOGRAPHS
    HART, M
    LANG, AR
    ACTA CRYSTALLOGRAPHICA, 1965, 19 : 73 - &
  • [39] Use of polycapillary X-ray lenses in the X-ray diffraction measurement of texture
    Welzel, U
    Leoni, M
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2002, 35 : 196 - 206
  • [40] Beyond hard x-ray photoelectron spectroscopy: Simultaneous combination with x-ray diffraction
    Rubio-Zuazo, Juan
    Castro, German R.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2013, 31 (03):