Simultaneous measurement of X-ray diffraction and ferroelectric polarization data as a function of applied electric field and frequency

被引：18
|
作者：
Wooldridge, Jenny [1 ]
Ryding, Steph [2 ]
Brown, Simon [3 ,4 ]
Burnett, Tim L. [1 ]
Cain, Markys G. [1 ]
Cernik, Robert [2 ]
Hino, Ricardo
Stewart, Mark [1 ]
Thompson, Paul [3 ,4 ]
机构：
[1] Natl Phys Lab, Teddington TW11 0LW, Middx, England
[2] Manchester Mat Sci Ctr, Manchester M13 9PL, Lancs, England
[3] ESRF, XMaS, UK CRG, F-38043 Grenoble, France
[4] Univ Liverpool, Liverpool L69 3BX, Merseyside, England
来源：
JOURNAL OF SYNCHROTRON RADIATION | 2012年 / 19卷
基金：
英国工程与自然科学研究理事会;
关键词：
ferroelectric; polarization; dynamic; in situ; X-ray diffraction; HIGH-RESOLUTION DIFFRACTION; SINGLE-CRYSTALS; RELAXOR FERROELECTRICS; PERFORMANCE; BEAMLINE; BEHAVIOR; ESRF;
D O I：
10.1107/S0909049512025782
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The characteristics of a new ferroelectric measurement system at the European Synchrotron Radiation Facility are presented. The electric-field-induced phase transitions of Pb(Mg1/3Nb2/3)O-3-xPbTiO(3) are determined via in situ measurements of electric polarization within the synchrotron diffraction beamline. Real-time data collection methods on single-crystal samples are employed as a function of frequency to determine the microstructural origin of piezoelectric effects within these materials, probing the dynamic ferroelectric response.
引用
收藏
页码：710 / 716
页数：7
相关论文
共 50 条
  • [21] STRESS MEASUREMENT BY X-RAY DIFFRACTION
    LETNER, HR
    MALOOF, SR
    JOURNAL OF APPLIED PHYSICS, 1954, 25 (11) : 1440 - 1440
  • [22] Time-Resolved Nanobeam X-ray Diffraction of a Relaxor Ferroelectric Single Crystal under an Alternating Electric Field
    Aoyagi, Shinobu
    Aoyagi, Ayumi
    Takeda, Hiroaki
    Osawa, Hitoshi
    Sumitani, Kazushi
    Imai, Yasuhiko
    Kimura, Shigeru
    CRYSTALS, 2021, 11 (11)
  • [23] Response of the ferroelectric domain structure of morphotropic PZT to the application of an electric field - in-situ Synchrotron X-ray diffraction
    Schoenau, K. A.
    Schmitt, L. A.
    Knapp, M.
    Balke, N.
    Lupascu, D. C.
    Theissmann, R.
    Kungl, H.
    Leoni, M.
    Scardi, P.
    Fuess, H.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2006, 62 : S84 - S84
  • [24] POLARIZATION EFFECTS ON X-RAY MULTIPLE DIFFRACTION
    LUH, SW
    CHANG, SL
    ACTA CRYSTALLOGRAPHICA SECTION A, 1991, 47 : 502 - 510
  • [25] Role of Bias Electric Field for X-ray Diffraction Intensity by TGS Crystal in Transverse Electric Field
    Tsuge, Seigo
    Kikuta, Toshio
    Yamazaki, Toshinari
    Fugiel, Boguslaw
    FERROELECTRICS, 2015, 485 (01) : 27 - 33
  • [26] X-ray diffraction analysis as applied in pneumoconiosis
    Sweany, HC
    Klaas, R
    JOURNAL OF THE AMERICAN MEDICAL ASSOCIATION, 1939, 112 : 610 - 614
  • [27] X-ray diffraction applied to chemical analysis
    Davey, WP
    JOURNAL OF APPLIED PHYSICS, 1939, 10 (12) : 820 - 830
  • [28] X-ray diffraction and X-ray reflectivity applied to investigation of thin films
    Rafaja, D
    ADVANCES IN SOLID STATE PHYSICS 41, 2001, 41 : 275 - 286
  • [29] X-ray diffraction & residual stresses in ferroelectric cathodes
    Ravi, M.
    Bhat, K. S.
    Krupanidhi, S. B.
    EIGHTH IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE, 2007, : 177 - +
  • [30] Powder X-ray diffraction and microstructure in ferroelectric domains
    Valot, C
    Floquet, N
    Mesnier, M
    Niepce, JC
    JOURNAL DE PHYSIQUE IV, 1996, 6 (C4): : 71 - 89
12345