Novel Statistical Techniques for Conducting Accelerated Life Test to Demonstrate Product Reliability

被引:0
|
作者
Basha, Mustaq [1 ]
Ware, Nilesh R. [2 ]
机构
[1] DRDO Elect & Radar Dev & Estab, Bangaluru 560093, India
[2] Deemed Univ, DIAT, Pune 411024, India
关键词
Confidence level; Significance level; Producer risk; Consumer risk; Accelerated life testing; Reliability demonstration testing; Sample size; Mean time to failure; TEST PLANS; WEIBULL; DISTRIBUTIONS; DESIGN;
D O I
10.14429/dsj.72.17838
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
In Reliability Demonstration Testing (RDT), finding the right sample size is very important since the cost of the prototypes is high and difficult to make. If the sample size for the RDT is test is less, the amount of information obtained from the test will be insufficient, and the conclusion will be meaningless; on contrary, if the sample size is big/huge, the amount of information obtained from the test will be in excess of what is required, resulting in unnecessary costs. Most of the time, the required sample size and test time are decided based on the RDT test design. Resources required for RDT in terms of batch size and long testing-time is practically not feasible, due to limitation of the project schedule and budget. The reliability engineers must have a sound knowledge of type challenge/risk that is allowed for conducting RDT. The research paper with a case study provides the required information about the modern techniques adopted in reducing the sample-size and testing time with the help of accelerated test models such as Arrhenius, Erying etc., for conducting accelerated life test to demonstrate the product reliability.
引用
收藏
页码:732 / 741
页数:10
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