The grain orientations of some areas on industrially cast multicrystalline silicon wafers have been measured by using the EBSD technique in SEM. Wafers from the nearby material were processed to solar cells. The solar cell efficiency of this material was measured at various positions across the cells by LBIC having a FWHM spot diameter of 12 mum. The results show that 1) The grain size and the distribution of orientations of the grain normals of the wafers vary from the bottom to the top of the ingot, 2) The efficiency of the solar cells varies with grain orientations and the energy loss depends on the surface texturing appearance which depends on the orientation of the grains. This information may be used to optimise the solidification parameters to improve solar cell efficiency.