Blind Quality Evaluator of Tone-Mapped HDR and Multi-Exposure Fused Images for Electronic Display

The problem of reproducing high dynamic range (HDR) images on electronic display and photography with restricted dynamic range has gained a lot of interest in the consumer electronics community. There exist various approaches to this issue, e.g., tone mapping operators (TMOs) and multi-exposure fusion algorithms (MEFs). Many existing image quality assessment (IQA) methods have been proposed to compare images of quality degradation generated by TMOs/MEFs. Although promising performances have been achieved, they seldom consider local specific artifacts difference (i.e., abnormal exposure and color cast) related with the TMOs/MEFs. To address this limitation, this paper proposes a Blind Quality Evaluator of Tone-Mapped HDR and Multi-Exposure Fused Images (BQE-TM/MEFI). First, two purpose-designed segment models are utilized to distinguish well-exposedness dense patches (WEDPes) and non-WEDPes, color cast patches (CCPes) and non-CCPes respectively. Second, multiple quality-perception features are extracted to measure local artifacts: 1) structure and sharpness features from WEDPes, 2) saturation features from non-CCPes, and 3) edge structure features. Then, three new low-complexity regional features (over-exposure ratio, entropy and color confidence index) are calculated based on over-exposure segmentation model. Finally, all extracted features are aggregated into a machine-learning regression model to pool a quality score. The simplicity and good performance of the proposed method makes it suitable for electronic displays and other consumer electronics.