Child-Langmuir law in the Coulomb blockade regime

被引:40
作者
Zhu, Yingbin [1 ]
Ang, L. K. [1 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
关键词
OF-FLIGHT TECHNIQUE; SPACE-CHARGE; EMISSION; VACUUM;
D O I
10.1063/1.3549868
中图分类号
O59 [应用物理学];
学科分类号
摘要
The one-dimensional (1D) classical Child-Langmuir (CL) law has been extended to the Coulomb blockade (single to few electrons) regime, including the effect of single-electron charging. It is found that there is a threshold of voltage (V-th) equals to one-half of the single-electron charging energy for electron injection assuming zero barrier at the interface. For voltage in the range of 1 < V/V-th < 2, there is only one electron inside the gap, and the time-averaged single-electron injected current is equal or higher than the 1D CL current. (c) 2011 American Institute of Physics. [doi: 10.1063/1.3549868]
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页数:3
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