Stability Analysis of W-Band Extended Interaction Output Cavity

被引：0

作者：

Zhong, Yong ^{[1
]}

Wang, Yong ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Elect, Key Lab High Power Microwave Sources & Technol, Beijing 100190, Peoples R China

来源：

IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE | 2014年

关键词：

w-band; extended; interaction; output cavity;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, a novel w-band extended interaction output cavity stability analysis is presented. Adopting beam quality factor and PIC code, stability analysis of the eight ladder grids cavity is discussed for the 2 pi operation mode. Results show that reasonable beam quality factor can reach more stable output power without oscillation of parasitic mode.

引用

页码：343 / 344

页数：2

共 4 条

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[2]

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