Design and optimization of dual-threshold circuits for low-voltage low-power applications

被引:182
作者
Wei, LQ [1 ]
Chen, ZP
Roy, K
Johnson, MC
Ye, YB
De, VK
机构
[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
[2] Intel Corp, Microcomp Res Labs, Hillsboro, OR 97124 USA
基金
美国国家科学基金会;
关键词
CMOS critical-path; delay; high performance; low-power design; low voltage; power estimation;
D O I
10.1109/92.748196
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Reduction in leakage power has become an important concern in ion-voltage, low-power, and high-performance applications. In this paper,(1) we use the dual-threshold technique to reduce leakage power by assigning a high-threshold voltage to some transistors in noncritical paths, and using low-threshold transistors in critical path(s), In order to achieve the best leakage po tr-er saving under target performance constraints, an algorithm is presented for selecting and assigning an optimal high-threshold voltage. A general leakage current model which has been verified by HSPICE simulations is used to estimate leakage power. Results show that the dual-threshold technique is good for leakage power reduction during both standby and active modes. For some ISCAS benchmark circuits, the leakage power can he reduced by more than 80%. The total active power saving can be around 50% and 20% at low- and high-snitching activities, respectively.
引用
收藏
页码:16 / 24
页数:9
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