A Proto-type ESD Generator for System Immunity Test of Wearable Devices

被引：0

作者：

Park, Junsik ^{[1
]}

Lee, Jongsung ^{[2
]}

Jo, Cheolgu ^{[2
]}

Seol, Byongsu ^{[2
]}

Kim, Jingook ^{[1
]}

机构：

[1] Ulsan Natl Inst Sci & Technol UNIST, Sch ECE, Ulsan, South Korea

[2] Samsung Elect Co, Global Technol Ctr, Suwon, South Korea

来源：

2018 40TH ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM (EOS/ESD) | 2018年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A proto-type ESD generator for system immunity test of wearable devices is proposed. A wearable device is charged up to an ESD test voltage together with the designed ESD generator, and discharged to the ESD current target. The proposed ESD generator for wearable devices is validated with a real ESD measurement.

引用

页数：6

共 11 条

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