Piezoresponse force microscopy (PFM)

被引：365
|
作者：
Soergel, Elisabeth [1 ]
机构：
[1] Univ Bonn, Inst Phys, D-53115 Bonn, Germany
来源：
JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2011年 / 44卷 / 46期
关键词：
FERROELECTRIC DOMAIN-STRUCTURES; PIEZOELECTRIC COEFFICIENT MEASUREMENTS; PERIODICALLY POLED LINBO3; LITHIUM-NIOBATE; THIN-FILMS; SINGLE-CRYSTALS; SPONTANEOUS POLARIZATION; DETECTION MECHANISM; PHOTONIC CRYSTAL; NONLINEAR OPTICS;
D O I：
10.1088/0022-3727/44/46/464003
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Piezoresponse force microscopy (PFM) detects the local piezoelectric deformation of a sample caused by an applied electric field from the tip of a scanning force microscope. PFM is able to measure deformations in the sub-picometre regime and can map ferroelectric domain patterns with a lateral resolution of a few nanometres. These two properties have made PFM the preferred technique for recording and investigating ferroelectric domain patterns. In this review we shall describe the technical aspects of PFM for domain imaging. Particular attention will be paid to the quantitative analysis of PFM images.
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页数：17
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