Properties of brush plated CdxZn1-xTe thin films

被引：12

作者：

Murali, K. R. ^{[1
]}

机构：

[1] Cent Electrochem Res Inst, Electrochem Mat Sci Div, Karaikkudi 630006, Tamil Nadu, India

来源：

SOLAR ENERGY | 2008年 / 82卷 / 03期

关键词：

D O I：

10.1016/j.solener.2007.07.007

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Cd(x)Zn(1-x)Te (0 <= x <= 0.5) thin films were deposited for the first time by the brush plating technique using cadmium sulphate, zinc sulphate and tellurium dioxide precursors. The deposition current density was maintained at 100 mA cm(-2). X-ray diffraction studies indicated the formation of cubic phase with (1 1 1), (2 2 0), (3 1 1) orientations. From optical absorption measurements the band gaps of the films are found to be direct. AFM studies indicate a surface roughness around 54 A. Density of the films of different composition has been estimated. Laser Raman studies indicated CdTe like LO and TO phonons. (C) 2007 Elsevier Ltd. All rights reserved.

引用

页码：220 / 225

页数：6

共 23 条

[1] REFRACTIVE-INDEX DISPERSION IN ZN1-CHI-CD-CHI-TE TERNARY ALLOYS [J].

ADACHI, S ;

KIMURA, T .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (9A) :3866-3867

[2] OPTICAL-CONSTANTS OF ZN1-XCDXTE TERNARY ALLOYS - EXPERIMENT AND MODELING [J].

ADACHI, S ;

KIMURA, T .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (08) :3496-3501

[3] LOW-COST TECHNIQUE FOR PREPARING CD1-XZNX TE FILMS AND SOLAR-CELLS [J].

BASOL, BM ;

KAPUR, VK ;

FERRIS, ML .

JOURNAL OF APPLIED PHYSICS, 1989, 66 (04) :1816-1821

[4] PREPARATION AND OPTICAL-PROPERTIES OF CD1-XZNXTE FILMS [J].

CHATTOPADHYAY, KK ;

SARKAR, A ;

CHAUDHURI, S ;

PAL, AK .

VACUUM, 1991, 42 (17) :1113-1116

[5] FILMS AND JUNCTIONS OF CADMIUM ZINC TELLURIDE [J].

CHU, TL ;

CHU, SS ;

FEREKIDES, C ;

BRITT, J .

JOURNAL OF APPLIED PHYSICS, 1992, 71 (11) :5635-5640

[6] GROWTH OF CD1-XZNX TE BY MOLECULAR-BEAM EPITAXY [J].

FELDMAN, RD ;

AUSTIN, RF ;

DAYEM, AH ;

WESTERWICK, EH .

APPLIED PHYSICS LETTERS, 1986, 49 (13) :797-799

[7] X-RAY PHOTOELECTRON-SPECTROSCOPY AND ATOMIC-FORCE MICROSCOPY CHARACTERIZATION OF THE EFFECTS OF ETCHING ZNXCD1-XTE SURFACES [J].

GEORGE, MA ;

AZOULAY, M ;

JAYATIRTHA, HN ;

BURGER, A ;

COLLINS, WE ;

SILBERMAN, E .

SURFACE SCIENCE, 1993, 296 (02) :231-240

[8]

HARADA H, 1970, J PHYS SOC JPN, V30, P1628

[9] STUDY OF CLEAVED, OXIDIZED, ETCHED, AND HEAT-TREATED CDTE SURFACES [J].

HARING, JP ;

WERTHEN, JG ;

BUBE, RH ;

GULBRANDSEN, L ;

JANSEN, W ;

LUSCHER, P .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (03) :1469-1472

[10] THE REFRACTIVE-INDEX OF THE TERNARY COMPOUNDS CDXZN1-XTE AND HGXZN1-XTE [J].

JENSEN, B ;

TORABI, A .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1983, 19 (09) :1362-1365

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