Influence of Ion Bombardment onto Phosphor Layer on Temporal Image Sticking in Alternating-Current Plasma Display Panel
被引:7
作者:
Park, Choon-Sang
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机构:
Kyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Taegu 702701, South KoreaKyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Taegu 702701, South Korea
Park, Choon-Sang
[1
]
Kim, Sang-Yup
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机构:
LG Elect Inc, PDP Res Dept 2, PDP Module Grp 1, Gumi 730030, Gyeongbuk, South KoreaKyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Taegu 702701, South Korea
Kim, Sang-Yup
[2
]
Jung, Eun-Young
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机构:
Samsung SDI Co Ltd, Core Technol Lab, Corp R&D Ctr, Cheonan 330300, Chungnam, South KoreaKyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Taegu 702701, South Korea
Jung, Eun-Young
[3
]
Tae, Heung-Sik
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机构:
Kyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Taegu 702701, South KoreaKyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Taegu 702701, South Korea
Tae, Heung-Sik
[1
]
机构:
[1] Kyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Taegu 702701, South Korea
[2] LG Elect Inc, PDP Res Dept 2, PDP Module Grp 1, Gumi 730030, Gyeongbuk, South Korea
[3] Samsung SDI Co Ltd, Core Technol Lab, Corp R&D Ctr, Cheonan 330300, Chungnam, South Korea
BLUE PHOSPHOR;
MGO SURFACE;
AC-PDP;
IMPROVEMENT;
LUMINANCE;
VOLTAGE;
D O I:
10.1143/JJAP.50.070210
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
We found that ion bombardment onto a phosphor layer during a sustained discharge was a key factor in inducing temporal image sticking of alternating-current (AC) plasma display panels (PDPs) through facilitated absorption of H2O onto the phosphor layer. We also found that ion bombardment onto the phosphor layer during the sustain discharge strongly depended on the bias conditions of the address electrode on which the phosphor layers were deposited. As a result, the positive-biased or floated address electrode condition could minimize the ion bombardment onto the phosphor layer during the sustain discharge, thus suppressing the absorption of H2O onto the phosphor layer, and ultimately preventing temporal image sticking. (C) 2011 The Japan Society of Applied Physics