Near-field scanning optical microscopy

被引：25
作者：
Buratto, SK
机构：
[1] Department of Chemistry, University of California, Santa Barbara
来源：
CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE | 1996年 / 1卷 / 04期
关键词：
D O I：
10.1016/S1359-0286(96)80062-3
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Near-field scanning optical microscopy (NSOM) is a new scanned probe microscopy technique capable of combining high spatial resolution (10-100 nm) and optical contrast. NSOM can be applied to a wide variety of materials, including semiconductors, molecular crystals, polymers and ceramics. The results are images of unprecedented detail which provide important new insights into the mesoscale physics of these materials.
引用
收藏
页码：485 / 492
页数：8
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