A time-to-digital-converter-based CMOS smart temperature sensor

被引：228

作者：

Chen, P ^{[1
]}

Chen, CC ^{[1
]}

Tsai, CC ^{[1
]}

Lu, WF ^{[1
]}

机构：

[1] Natl Taiwan Univ Sci & Technol, Dept Elect Engn, Taipei 10617, Taiwan

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 2005年 / 40卷 / 08期

关键词：

delay line; intelligent sensor; temperature sensor; time-to-digital converter (TDC);

D O I：

10.1109/JSSC.2005.852041

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A time-to-digital-converter-based CMOS smart temperature sensor without a voltage/current analog-to-digital converter (ADC) or bandgap reference is proposed for high-accuracy portable applications. Conventional smart temperature sensors rely on voltage/current ADCs for digital output code conversion. For the purpose of cost reduction and power savings, the proposed smart temperature sensor first generates a pulse with a width proportional to the measured temperature. Then, a cyclic time-to-digital converter is utilized to convert the pulse into a corresponding digital code. The test chips have an extremely small area of 0.175 mm(2) and were fabricated in the TSMC CMOS 0.35-mu m 2P4M process. Due to the excellent linearity of the digital output, the achieved measurement error is merely -0. 7 similar to +0.9 degrees C after two point calibration, but without any curvature correction or dynamic offset cancellation. The effective resolution is better than 0.16 degrees C, and the power consumption is under 10 mu W at a sample rate of 2 samples/s.

引用

页码：1642 / 1648

页数：7

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