Reliability tests of ultrasonic bonding methods using HAST and THB technology

被引:0
作者
Dominkovics, C [1 ]
Németh, P [1 ]
机构
[1] Budapest Univ Technol & Econ, Dept Elect Technol, H-1111 Budapest, Hungary
来源
27TH INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY, BOOKS 1-3, CONFERENCE PROCEEDINGS: MEETING THE CHALLENGES OF ELECTRONICS TECHNOLOGY PROGRESS | 2004年
关键词
reliability; life time HAST; THB; ultrasonic bonding;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Reliability is one of the most important questions in any applications both on package (component), and on board (system) level. This paper describes some life time test methods, equipment and processes for evaluating the most important reliability parameters. It gives a detailed description of the most effective and economical HAST and THB method. The paper presents some new results of using the HAST and THB technology at the following fields of the reliability and life time tests: (.) reliability analyzing of assembled SMD passive components (.) water addition speed tests Finally the paper particularly deals with the ultrasonic bonding technology, the bonding and testing machines. It introduces some measuring test results on the bonding force before and after a HAST and THB test.
引用
收藏
页码:198 / 201
页数:4
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