共 6 条
[1]
HARSANYI G, 2001, P 34 INT S MICR IMAP
[2]
Accelerated life time test methods for new package technologies
[J].
24TH INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY: CONCURRENT ENGINEERING IN ELECTRONIC PACKAGING, CONFERENCE PROCEEDINGS,
2001,
:215-219
[3]
Review of the reliability of advanced component packaging technologies
[J].
50TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE - 2000 PROCEEDINGS,
2000,
:1605-1609
[4]
Peck D. S., 1986, 24th Annual Proceedings Reliability Physics 1986 (Cat. No.86CH2256-6), P44, DOI 10.1109/IRPS.1986.362110
[5]
PECK DS, 1989, TRAPP ACCELERATED TE
[6]
Sinnadurai N, 2000, P SOC PHOTO-OPT INS, V4339, P733