Monitoring of paint drying process by digital speckle correlation

被引：32

作者：

Yamaguchi, Ichirou ^{[1
]}

Yokota, Masayuki ^{[1
]}

Ida, Takasi ^{[1
]}

Sunaga, Mizuki ^{[1
]}

Kobayashi, Koichi ^{[2
]}

机构：

[1] Gunma Univ, Fac Engn, Dept Elect Engn, Kiryu, Gunma 3768515, Japan

[2] Toyo Seiki Seisaku Sho Ltd, Itabashi Ku, Tokyo 1740041, Japan

来源：

OPTICAL REVIEW | 2007年 / 14卷 / 06期

关键词：

digital speckle correlation; paint drying process; noncontact;

D O I：

10.1007/s10043-007-0362-0

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The state of drying paint is monitored from the dynamic behaviors of the speckle pattern arising from laser illumination of the region inspected. Temporal variation of the peak height of the cross-correlation function between successive frames taken with a fixed interval is plotted until the peak maintains a stationary maximum value. We used a speckle pattern in the diffraction field for monitoring of a single region and that in the image field for simultaneous monitoring of various regions. Both the normal and the phase-only algorithms we're compared for cross-correlation computation. The former showed more distinct variation of peak height. (C) 2007 The Optical Society of Japan.

引用

页码：362 / 364

页数：3

共 6 条

[1] Speckle time evolution characterization by the co-occurrence matrix analysis [J].

Arizaga, R ;

Trivi, M ;

Rabal, H .

OPTICS AND LASER TECHNOLOGY, 1999, 31 (02) :163-169

[2]

Groh G., 1970, ENG USES HOLOGRAPHY, P483

[3] SPECKLE DISPLACEMENT AND DECORRELATION IN THE DIFFRACTION AND IMAGE FIELDS FOR SMALL OBJECT DEFORMATION [J].

YAMAGUCHI, I .

OPTICA ACTA, 1981, 28 (10) :1359-1376

[4] Measurement of surface roughness by speckle correlation [J].

Yamaguchi, I ;

Kobayashi, K ;

Yaroslavsky, L .

OPTICAL ENGINEERING, 2004, 43 (11) :2753-2761

[5] Holography, speckle, and computers [J].

Yamaguchi, I .

OPTICS AND LASERS IN ENGINEERING, 2003, 39 (04) :411-429

[6] Terahertz paintmeter for noncontact monitoring of thickness and drying progress in paint film [J].

Yasui, T ;

Yasuda, T ;

Sawanaka, K ;

Araki, T .

APPLIED OPTICS, 2005, 44 (32) :6849-6856

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