Random blisters on stickers: metrology through defects

被引:14
作者
Aoyanagi, Yuko [1 ,2 ,3 ]
Hure, Jeremy [1 ,2 ]
Bico, Jose [1 ,2 ]
Roman, Benoit [1 ,2 ]
机构
[1] UPMC, CNRS, UMR 7636, F-75231 Paris 05, France
[2] Univ Paris Diderot, ESPCI ParisTech, F-75231 Paris 05, France
[3] Ochanomizu Univ, Dept Phys, Bunkyo Ku, Tokyo 1128610, Japan
关键词
FOURIER-TRANSFORM PROFILOMETRY; THIN-FILMS; STRETCHABLE ELECTRONICS; DELAMINATION; MECHANICS; GRAPHENE; POLYMER; SHEETS;
D O I
10.1039/c0sm00436g
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Blisters are commonly observed when an adhesive sheet is carelessly deposited on a plate. Although such blisters are usually not desired for practical applications, we show through model experiments on angular blisters how material properties can be deduced from height profile measurements. In particular the typical curvature of the crests is found to be proportional to an elasto-capillary length that compares the bending stiffness of the sheet with the adhesion energy. In addition, the radius of the tip allows the estimation of the product of this length with the thickness of the sheet. The relevance of these results to realistic random configurations is finally confirmed.
引用
收藏
页码:5720 / 5728
页数:9
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