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- [32] Investigation into inhomogeneous electrical and optical properties of indium tin oxide film using spectroscopic ellipsometry with multi-layer optical models OPTICAL MATERIALS EXPRESS, 2014, 4 (01): : 43 - 56
- [33] Determination of complex optical constants of uniaxial HgI2 by spectroscopic conventional and generalized ellipsometry PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1999, 175 (01): : 413 - 419
- [36] Modeling of optical constants of InGaAs and InAlAs measured by spectroscopic ellipsometry J Cryst Growth, (1081-1084):