Determination the Optical Constants of Hafnium Oxide Film by Spectroscopic Ellipsometry with Various Dispersion Models

被引:1
|
作者
Gao, Weidong [1 ]
Zhang, Yinhua [1 ]
Liu, Hongxiang [1 ]
机构
[1] Chinese Acad Sci, Inst Opt & Elect, Chengdu 610209, Si Chuan, Peoples R China
关键词
HfO(2); Film; Spectroscopic ellipsometry; Optical constants; DIELECTRICS; MIRRORS;
D O I
10.1117/12.865979
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Optical constants of vacuum-deposited hafnium oxide film (HfO(2)) from infrared to ultraviolet spectral region (215nm-1700nm) have been determined by variable angle Spectroscopic ellipsometry with Cauchy dispersion model, Sellmeier dispersion model, Cauchy-Urbach dispersion model and Tauc-Lorentz dispersion model, respectively. The optical constants of the HfO(2) film which were extracted with the four dispersion models have been compared. The surface roughness layer between HfO(2) film and air and the interface layer between the film and the substrate have also been modeled with Bruggeman effective medium approximation (BEMA).
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页数:8
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