How long should I simulate, and for how many trials? A practical guide to reliability simulations

被引：4

作者：

Murphy, KE ^{[1
]}

Carter, CM ^{[1
]}

Wolfe, LH ^{[1
]}

机构：

[1] ARINC, Albuquerque, NM 87106 USA

来源：

ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM, 2001 PROCEEDINGS | 2001年

关键词：

simulation; steady state availability; endurability; mission reliability; rules of thumb; horn of variance; horn of confidence;

D O I：

10.1109/RAMS.2001.902468

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

We have provided RAM analysts with practical rules of thumb that facilitate the resolution of how long and how many trials are appropriate for simulations that focus on particular RAM parameters. The rules of thumb provide a structured methodology that determines a solution space as a function of simulation length and number of trials such that the value of the RAM parameter in question can be considered "good enough". What is defined to be good enough, depends on the analyst's tolerance for the magnitude of the error in the output. This paper provides the applied RAM analyst with a philosophy as to how to approach the resolution of the two most ubiquitous yet burdensome of RAM simulation questions.

引用

页码：207 / 212

页数：6