Fundamental study of interface layer formation in reactive Al-based reactive thin films

被引：0
|
作者：
Lu, Yingzhen [1 ]
Chabal, Yves J. [1 ]
Glavier, Ludovic [2 ]
Rossi, Carole [2 ,3 ]
Esteve, Alain [2 ,3 ]
机构：
[1] Univ Texas Dallas, Dept Mat Sci & Engn, Richardson, TX 75080 USA
[2] CNRS, LAAS, F-31077 Toulouse, France
[3] Univ Toulouse, LAAS, F-31062 Toulouse, France
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2014年 / 247卷
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中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
305-ENFL
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页数：1
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