An Automated Test Assembly Design for a Large-Scale Chinese Proficiency Test

被引：10
|
作者：
Wang, Shiyu [1 ]
Zheng, Yi [2 ]
Zheng, Chanjin [1 ]
Su, Ya-Hui [3 ]
Li, Peize [4 ,5 ]
机构：
[1] Univ Illinois, 725 South Wright St, Champaign, IL 61820 USA
[2] Arizona State Univ, Tempe, AZ USA
[3] Natl Chung Cheng Univ, Chiayi 621, Taiwan
[4] Chinese Testing Int Co Ltd, Beijing, Peoples R China
[5] Tsinghua Univ, Beijing 100084, Peoples R China
来源：
APPLIED PSYCHOLOGICAL MEASUREMENT | 2016年 / 40卷 / 03期
关键词：
achievement testing; computerized test assembly; test assembly;
D O I：
10.1177/0146621616628503
中图分类号：
O1 [数学]; C [社会科学总论];
学科分类号：
03 ; 0303 ; 0701 ; 070101 ;
摘要：
[No abstract available]
引用
收藏
页码：233 / 237
页数：5
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