Formation of electron internal transport barriers by highly localized electron cyclotron resonance heating in the large helical device

被引：58

作者：

Shimozuma, T

Kubo, S

Idei, H

Yoshimura, Y

Notake, T

Ida, K

Ohyabu, N

Yamada, I

Narihara, K

Inagaki, S

Nagayama, Y

Takeiri, Y

Funaba, H

Muto, S

Tanaka, K

Yokoyama, M

Murakami, S

Osakabe, M

Kumazawa, R

Ashikawa, N

Emoto, M

Goto, M

Ikeda, K

Isobe, M

Kobichi, T

Liang, Y

Masuzaki, S

Minami, T

Miyazawa, J

Morita, S

Morisaki, T

Mutoh, T

Nakanishi, H

Nishimura, K

Noda, N

Ohdachi, S

Oka, Y

Ozaki, T

Peterson, BJ

Narushima, Y

Sagara, A

Saito, K

Sakakibara, S

Sakamoto, R

Sasao, M

Sato, M

Satoh, K

Seki, T

Shoji, S

Suzuki, H

机构：

[1] Natl Inst Fus Sci, Toki 5095292, Japan

[2] Nagoya Univ, Grad Sch Energy Engn & Sci, Chikusa Ku, Nagoya, Aichi 4648601, Japan

[3] Grad Univ Adv Studies, Toki 5095292, Japan

来源：

PLASMA PHYSICS AND CONTROLLED FUSION | 2003年 / 45卷 / 07期

关键词：

D O I：

10.1088/0741-3335/45/7/310

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

Internal transport barriers with respect to electron thermal transport (eITB) were observed in the large helical device, when the electron cyclotron resonance heating (ECH) power was highly localized on the centre of a plasma sustained by neutral beam injection. The eITB is characterized by a high central electron temperature of 6-8 keV with an extremely steep gradient, as high as 55 keV m(-1) and a low electron thermal diffusivity within a normalized average radius rho approximate to 0.3 as well as by the existence of clear thresholds for the ECH power and plasma collisionality.

引用

页码：1183 / 1192

页数：10

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