Experimental investigations of glow discharges in hollow cathode geometries at low pressure

被引：4

作者：

Callegari, T ^{[1
]}

Gegot, F ^{[1
]}

Pitchford, LC ^{[1
]}

Galy, J ^{[1
]}

Boeuf, JP ^{[1
]}

机构：

[1] Univ Toulouse 3, CNRS, CPAT, F-31062 Toulouse, France

来源：

IEEE TRANSACTIONS ON PLASMA SCIENCE | 2005年 / 33卷 / 02期

关键词：

charge coupled device (CCD) imaging; glow discharges; micro hollow cathode; plasma simulation;

D O I：

10.1109/TPS.2005.845929

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

We present results of optical and electrical measurements of glow discharges in hollow cathode geometries in low-pressure xenon. These are helpful for understanding results in micro hollow cathode discharges operating at higher pressure.

引用

页码：384 / 385

页数：2

共 3 条

[1] Predicted properties of microhollow cathode discharges in xenon [J].

Boeuf, JP ;

Pitchford, LC ;

Schoenbach, KH .

APPLIED PHYSICS LETTERS, 2005, 86 (07) :1-3

[2] Diagnostics and modeling of a macroscopic plasma display panel cell [J].

Callegari, T ;

Ganter, R ;

Boeuf, JP .

JOURNAL OF APPLIED PHYSICS, 2000, 88 (07) :3905-3913

[3] High-pressure hollow cathode discharges [J].

Schoenbach, KH ;

ElHabachi, A ;

Shi, WH ;

Ciocca, M .

PLASMA SOURCES SCIENCE & TECHNOLOGY, 1997, 6 (04) :468-477

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