Ion Desorption from Single-Walled Carbon Nanotubes Induced by Soft X-ray Illumination

被引：3

作者：

Mera, Yutaka ^{[1
]}

Fujiwara, Takayuki ^{[1
]}

Ishizaki, Kiichiro ^{[1
]}

Xiang, Rong ^{[2
]}

Shiomi, Junichiro ^{[2
]}

Maruyama, Shigeo ^{[2
]}

Kakiuchi, Takuhiro ^{[3
]}

Mase, Kazuhiko ^{[3
,4
]}

Maeda, Koji ^{[1
]}

机构：

[1] Univ Tokyo, Dept Appl Phys, Bunkyo Ku, Tokyo 1138656, Japan

[2] Univ Tokyo, Dept Mech Engn, Bunkyo Ku, Tokyo 1138656, Japan

[3] Grad Univ Adv Studies, Tsukuba, Ibaraki 3050801, Japan

[4] KEK, Inst Mat Struct Sci, Tsukuba, Ibaraki 3050801, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 2010年 / 49卷 / 10期

关键词：

LOW-ENERGY-ELECTRON; IRRADIATION DAMAGE; FILMS; COINCIDENCE; DIAMETER; SPECTROSCOPY; ABSORPTION; EXCITATION; SURFACES; DEFECTS;

D O I：

10.1143/JJAP.49.105104

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have investigated ion desorption from single-walled carbon nanotubes (SWNTs) that is induced by soft X-ray illumination in the C 1s core-excitation energy range in order to have insight to the mechanism of defect formation caused by the similar excitation. The mass of desorbed ions was analyzed by a time-of-flight (TOF) spectrometer and the photon energy dependence of the ion yield or the desorption efficiency spectra were measured as a function of the monochromatic photon energy used for illumination. Experimental results exclude the simple detachment of carbon atoms constituting the nanotubes from the cause of the defect formation. Also the photo-induced etching of carbon atoms associated with C-H bond rupture is ruled out from the defect formation mechanism. Auger mechanisms to explain the photo-induced desorption are discussed. (C) 2010 The Japan Society of Applied Physics

引用

页码：1051041 / 1051045

页数：5

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