Testing degradation and Predicting the lifetimes of giant magneto-resistive (GMR) heads under mechanically and thermally accelerated conditions are discussed. Our experiments revealed that accumulated mechanical acceleration can cause gradual and continuous head degradation. The amplitude loss was proportional to the integrated acoustic emission (AE) signal, and the amplitude loss rate to the integrated AE was a function of GMR temperature. Lifetime predictions with these parameters are presented.
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Toshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, JapanToshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, Japan
Saito, AT
Iwasaki, H
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Toshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, JapanToshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, Japan
Iwasaki, H
Kamiguchi, Y
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Toshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, JapanToshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, Japan
Kamiguchi, Y
Fuke, HN
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Toshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, JapanToshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, Japan
Fuke, HN
Sahashi, M
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Toshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, JapanToshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, Japan
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Toshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, JapanToshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, Japan
Saito, AT
Iwasaki, H
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Toshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, JapanToshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, Japan
Iwasaki, H
Kamiguchi, Y
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Toshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, JapanToshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, Japan
Kamiguchi, Y
Fuke, HN
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Toshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, JapanToshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, Japan
Fuke, HN
Sahashi, M
论文数: 0引用数: 0
h-index: 0
机构:
Toshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, JapanToshiba Res & Dev Ctr, Mat & Devices Res Labs, Saiwai Ku, Kawasaki, Kanagawa 210, Japan