Degradation testing and lifetime predictions for GMR heads under mechanically and thermally accelerated conditions

被引:10
作者
Imamura, T [1 ]
Yamamoto, K
机构
[1] Fujitsu Labs Ltd, Magnet Disk Drive Lab, Atsugi, Kanagawa 2430197, Japan
[2] Fujitsu Ltd, HDI Engn Dept, Kawasaki, Kanagawa 2118588, Japan
关键词
acoustic emissions (AEs); degradation; giant magneto-resistive (GMR) heads; lifetime predictions;
D O I
10.1109/TMAG.2005.855257
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Testing degradation and Predicting the lifetimes of giant magneto-resistive (GMR) heads under mechanically and thermally accelerated conditions are discussed. Our experiments revealed that accumulated mechanical acceleration can cause gradual and continuous head degradation. The amplitude loss was proportional to the integrated acoustic emission (AE) signal, and the amplitude loss rate to the integrated AE was a function of GMR temperature. Lifetime predictions with these parameters are presented.
引用
收藏
页码:3037 / 3039
页数:3
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