Characterization of lithographically printed resistive strain gauges

被引：31

作者：

Hay, GI ^{[1
]}

Evans, PSA ^{[1
]}

Harrison, DJ ^{[1
]}

Southee, D ^{[1
]}

Simpson, G ^{[1
]}

Harrey, PM ^{[1
]}

机构：

[1] Brunel Univ, Sch Engn & Design, Uxbridge UB8 3PH, Middx, England

来源：

IEEE SENSORS JOURNAL | 2005年 / 5卷 / 05期

关键词：

conductive lithographic film (CLF); offset lithography; printed sensors; printed strain gauges;

D O I：

10.1109/JSEN.2005.845209

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper reports progress in sensor fabrication by the conductive lithographic film (CLF) printing process. Work describing strain-sensitive structures manufactured using a modified printing process and conductive inks is addressed. The performance of a "single-ink" strain-sensitive structure when printed on six alternative substrates (GlossArt, PolyArt, Teslin, Mylar C, Melinex, and Kapton) is analyzed. Though not intending to compete with conventional gauges in high-tolerance measurement, the structures exhibit properties that indicate suitability for novel applications.

引用

页码：864 / 871

页数：8

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