CNN-Based Brain Tumor Detection Model Using Local Binary Pattern and Multilayered SVM Classifier

被引:11
作者
Kolla, Morarjee [1 ]
Mishra, Rupesh Kumar [1 ]
Ul Huq, S. Zahoor [2 ]
Vijayalata, Y. [3 ]
Gopalachari, M. Venu [4 ]
Siddiquee, KazyNoor-E-Alam [5 ]
机构
[1] Chaitanya Bharthi Inst Technol, Dept Comp Sci & Engn, Hyderabad, Telangana, India
[2] G Pulla Reddy Engn Coll, Dept Comp Sci & Engn, Kurnool, Andhra Pradesh, India
[3] Gokaraju Rangaraju Inst Engn & Technol, Dept Comp Sci & Engn, Hyderabad, Telangana, India
[4] Chaitanya Bharthi Inst Technol, Dept Informat Technol, Hyderabad, Telangana, India
[5] Univ Sci & Technol, Dept Comp Sci & Engn, Chattogram, Bangladesh
关键词
MRI;
D O I
10.1155/2022/9015778
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
摘要
In this paper, an autonomous brain tumor segmentation and detection model is developed utilizing a convolutional neural network technique that included a local binary pattern and a multilayered support vector machine. The detection and classification of brain tumors are a key feature in order to aid physicians; an intelligent system must be designed with less manual work and more automated operations in mind. The collected images are then processed using image filtering techniques, followed by image intensity normalization, before proceeding to the patch extraction stage, which results in patch extracted images. During feature extraction, the RGB image is converted to a binary image by grayscale conversion via the colormap process, and this process is then completed by the local binary pattern (LBP). To extract feature information, a convolutional network can be utilized, while to detect objects, a multilayered support vector machine (ML-SVM) can be employed. CNN is a popular deep learning algorithm that is utilized in a wide variety of engineering applications. Finally, the classification approach used in this work aids in determining the presence or absence of a brain tumor. To conduct the comparison, the entire work is tested against existing procedures and the proposed approach using critical metrics such as dice similarity coefficient (DSC), Jaccard similarity index (JSI), sensitivity (SE), accuracy (ACC), specificity (SP), and precision (PR).
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页数:9
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