Scanning tunnelling microscopy of suspended graphene

被引:70
|
作者
Zan, Recep [1 ,2 ]
Muryn, Chris [3 ]
Bangert, Ursel [2 ]
Mattocks, Philip [4 ]
Wincott, Paul [5 ]
Vaughan, David [5 ]
Li, Xuesong [6 ,7 ,8 ]
Colombo, Luigi [9 ]
Ruoff, Rodney S. [6 ,7 ]
Hamilton, Bruce [4 ]
Novoselov, Konstantin S. [1 ]
机构
[1] Univ Manchester, Sch Phys & Astron, Manchester M13 9PL, Lancs, England
[2] Univ Manchester, Sch Mat, Manchester M13 9PL, Lancs, England
[3] Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England
[4] Univ Manchester, Photon Sci Inst, Manchester M13 9PL, Lancs, England
[5] Univ Manchester, Sch Earth Atmospher & Environm Sci, Manchester M13 9PL, Lancs, England
[6] Univ Texas Austin, Dept Mech Engn, Austin, TX 78712 USA
[7] Univ Texas Austin, Mat Sci & Engn Program, Austin, TX 78712 USA
[8] IBM Corp, TJ Watson Res Ctr, Yorktown Hts, NY USA
[9] Texas Instruments Inc, Dallas, TX 75243 USA
基金
英国工程与自然科学研究理事会;
关键词
LARGE-AREA; FILMS;
D O I
10.1039/c2nr30162h
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Suspended graphene has been studied by STM for the first time. Atomic resolution on mono- and bi-layer graphene samples has been obtained after ridding the graphene surface of contamination via high-temperature annealing. Static local corrugations (ripples) have been observed on both types of structures.
引用
收藏
页码:3065 / 3068
页数:4
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