Scanning tunnelling microscopy of suspended graphene

被引：70

作者：

Zan, Recep ^{[1
,2
]}

Muryn, Chris ^{[3
]}

Bangert, Ursel ^{[2
]}

Mattocks, Philip ^{[4
]}

Wincott, Paul ^{[5
]}

Vaughan, David ^{[5
]}

Li, Xuesong ^{[6
,7
,8
]}

Colombo, Luigi ^{[9
]}

Ruoff, Rodney S. ^{[6
,7
]}

Hamilton, Bruce ^{[4
]}

Novoselov, Konstantin S. ^{[1
]}

机构：

[1] Univ Manchester, Sch Phys & Astron, Manchester M13 9PL, Lancs, England

[2] Univ Manchester, Sch Mat, Manchester M13 9PL, Lancs, England

[3] Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England

[4] Univ Manchester, Photon Sci Inst, Manchester M13 9PL, Lancs, England

[5] Univ Manchester, Sch Earth Atmospher & Environm Sci, Manchester M13 9PL, Lancs, England

[6] Univ Texas Austin, Dept Mech Engn, Austin, TX 78712 USA

[7] Univ Texas Austin, Mat Sci & Engn Program, Austin, TX 78712 USA

[8] IBM Corp, TJ Watson Res Ctr, Yorktown Hts, NY USA

[9] Texas Instruments Inc, Dallas, TX 75243 USA

来源：

NANOSCALE | 2012年 / 4卷 / 10期

基金：

英国工程与自然科学研究理事会;

关键词：

LARGE-AREA; FILMS;

D O I：

10.1039/c2nr30162h

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Suspended graphene has been studied by STM for the first time. Atomic resolution on mono- and bi-layer graphene samples has been obtained after ridding the graphene surface of contamination via high-temperature annealing. Static local corrugations (ripples) have been observed on both types of structures.

引用

页码：3065 / 3068

页数：4

共 32 条

[1] Nanotopography of graphene [J].

Bangert, U. ;

Gass, M. H. ;

Bleloch, A. L. ;

Nair, R. R. ;

Eccles, J. .

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2009, 206 (09) :2115-2119

[2] Electronic confinement and coherence in patterned epitaxial graphene [J].

Berger, Claire ;

Song, Zhimin ;

Li, Xuebin ;

Wu, Xiaosong ;

Brown, Nate ;

Naud, Cecile ;

Mayou, Didier ;

Li, Tianbo ;

Hass, Joanna ;

Marchenkov, Atexei N. ;

Conrad, Edward H. ;

First, Phillip N. ;

de Heer, Wait A. .

SCIENCE, 2006, 312 (5777) :1191-1196

[3] Macroscopic graphene membranes and their extraordinary stiffness [J].

Booth, Tim J. ;

Blake, Peter ;

Nair, Rahul R. ;

Jiang, Da ;

Hill, Ernie W. ;

Bangert, Ursel ;

Bleloch, Andrew ;

Gass, Mhairi ;

Novoselov, Kostya S. ;

Katsnelson, M. I. ;

Geim, A. K. .

NANO LETTERS, 2008, 8 (08) :2442-2446

[4] Radiation damage in the TEM and SEM [J].

Egerton, RF ;

Li, P ;

Malac, M .

MICRON, 2004, 35 (06) :399-409

[5] Intrinsic ripples in graphene [J].

Fasolino, A. ;

Los, J. H. ;

Katsnelson, M. I. .

NATURE MATERIALS, 2007, 6 (11) :858-861

[6] Epitaxial Graphene on Cu(111) [J].

Gao, Li ;

Guest, Jeffrey R. ;

Guisinger, Nathan P. .

NANO LETTERS, 2010, 10 (09) :3512-3516

[7] Intrinsic and extrinsic corrugation of monolayer graphene deposited on SiO2 [J].

Geringer, V. ;

Liebmann, M. ;

Echtermeyer, T. ;

Runte, S. ;

Schmidt, M. ;

Rueckamp, R. ;

Lemme, M. C. ;

Morgenstern, M. .

PHYSICAL REVIEW LETTERS, 2009, 102 (07)

[8] Doping graphene with metal contacts [J].

Giovannetti, G. ;

Khomyakov, P. A. ;

Brocks, G. ;

Karpan, V. M. ;

van den Brink, J. ;

Kelly, P. J. .

PHYSICAL REVIEW LETTERS, 2008, 101 (02)

[9] Scanning tunnelling microscope imaging of nanoscale electron density gradients on the surface of GaAs [J].

Hamilton, B ;

Jacobs, J ;

Missous, M .

JOURNAL OF PHYSICS-CONDENSED MATTER, 2003, 15 (42) :S3083-S3093

[10] WSXM:: A software for scanning probe microscopy and a tool for nanotechnology [J].

Horcas, I. ;

Fernandez, R. ;

Gomez-Rodriguez, J. M. ;

Colchero, J. ;

Gomez-Herrero, J. ;

Baro, A. M. .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (01)

← 1 2 3 4 →