Reduced stochasticity in domain wall motion with increasing pinning density in thin Fe films

被引：8

作者：

Lee, Hun-Sung ^{[1
,2
]}

Ryu, Kwang-Su ^{[1
,2
,3
]}

You, Chun-Yeol ^{[4
]}

Jeon, Kun-Rok ^{[1
,2
]}

Parkin, Stuart S. P. ^{[3
]}

Shin, Sung-Chul ^{[1
,2
]}

机构：

[1] Korea Adv Inst Sci & Technol, Dept Phys, Taejon 305701, South Korea

[2] Korea Adv Inst Sci & Technol, Ctr Nanospin Spintron Mat, Taejon 305701, South Korea

[3] IBM Corp, Almaden Res Ctr, Div Res, San Jose, CA 95120 USA

[4] Inha Univ, Dept Phys, Inchon 402751, South Korea

来源：

NEW JOURNAL OF PHYSICS | 2011年 / 13卷

基金：

新加坡国家研究基金会;

关键词：

SCALING BEHAVIOR; UNIVERSALITY; AVALANCHES; CREEP;

D O I：

10.1088/1367-2630/13/8/083038

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report in this paper the decrease of the stochasticity of magnetization half-reversal time with increasing domain wall (DW) pinning in Fe films investigated by means of time-resolved magneto-optic Kerr microscopy. The domain images in the films reveal that the density of DW pinning sites increases with increasing Fe thickness. However, we found that the stochasticity of the magnetization half-reversal time significantly decreases with increasing DW pinning. The major reason for the reduced stochasticity is shown to be due to a thermally activated DW creep mechanism that becomes dominant during magnetization reversal due to increased DW pinning.

引用

页数：8

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