Comparison of secondary electron emission simulation to experiment

被引：13

作者：

Insepov, Z. ^{[1
]}

Ivanov, V. ^{[2
]}

Jokela, S. J. ^{[1
]}

Veryovkin, I. ^{[1
]}

Zinovev, A. ^{[1
]}

Frisch, H. ^{[1
]}

机构：

[1] Argonne Natl Lab, Argonne, IL 60439 USA

[2] Muons Inc, Batavia, IL 60610 USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2011年 / 639卷 / 01期

关键词：

Secondary electron emission; Monte Carlo simulation; Gold; YIELDS; FILMS; MGO;

D O I：

10.1016/j.nima.2010.10.048

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Monte Carlo simulation, empirical theories, and close comparison to experiment were used to parameterize the secondary electron emission (SEE) yields of several highly emissive materials for microchannel plates. In addition, a detailed experiment and analysis of gold were carried out at Argonne National Laboratory. The simulation results will be used in the selection of emissive and resistive materials for deposition and characterization experiments that will be conducted by a large-area fast detector project at Argonne. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：155 / 157

页数：3

共 21 条

[1] Anderson J.A., IEEE MIC 2008, pID
[2] Beaulieu D.R., 2009, P AVS TOP C AT LAYER
[3] Test of the new hybrid INTEVAC intensified photocell for the use in air Cherenkov telescopes
Bradbury, SM
Mirzoyan, R
Gebauer, J
Feigl, E
Lorenz, E
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1997, 387 (1-2) : 45 - 49
[4] Bronstein I.M., 1969, VTORICHNAYA ELEKT EM
[5] SECONDARY ELECTRON EMISSION YIELDS OF SOME CERAMICS
DAWSON, PH
[J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (09) : 3644 - &
[6] DEKKER AJ, 1958, SOLID STATE PHYS, V6, P251
[7] Gornyi N.B., 1954, SOV PHYS JETP, V26, P88
[8] Ishimura S., 1980, J APPL PHYS, V51, P2853
[9] Joy D. C., 2009, COMMUNICATION
[10] Joy D. C., 1995, MONTE CARLO MODELING

← 1 2 3 →