Room temperature operated single electron transistor made by a scanning tunnelling microscopy/atomic force microscopy nano-oxidation process

被引:4
|
作者
Matsumoto, K [1 ]
机构
[1] MITI, Electrotech Lab, Tsukuba, Ibaraki 305, Japan
关键词
D O I
10.1080/002072199133292
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Application of scanning tunnelling microscopy (STM) and atomic force microscopy (AFM) to an electron device is introduced in this paper. Using a STM tip/AFM cantilever as a cathode, the surface of a metal is oxidized to form a few tens of nanometre wide oxidized metal line, which works as an energy barrier for an electron. A single electron transistor (SET) is fabricated using this fabrication process. As a STM/AFM, nano-oxidation process could fabricate the device size of the order of 10 nm, the fabricated SET operates even at a higher temperature than room temperature and shows the large Coulomb gap and staircase of 200 mV periods. An atomically Aat alpha-Al2O3 substrate is proposed for improving the uniformity and reproducibility of the oxidized line made by a STM/AFM nano-oxidation process.
引用
收藏
页码:641 / 662
页数:22
相关论文
共 50 条
  • [41] An scanning tunnelling microscopy study of the diffusion of a single or a pair of atomic vacancies
    Mayne, AJ
    Rose, F
    Bolis, C
    Dujardin, G
    SURFACE SCIENCE, 2001, 486 (03) : 226 - 238
  • [42] Single atomic manipulation and writing with scanning tunnelling microscopy at low temperatures
    Gu, CZ
    Braun, KF
    Rieder, KH
    CHINESE PHYSICS, 2002, 11 (10): : 1042 - 1046
  • [43] Fabrication of nanogap electrodes via nano-oxidation mask by scanning probe microscopy nanolithography
    Rouhi, Jalal
    Mahmud, Shahrom
    Hutagalung, Sabar Derita
    Kakooei, Saeid
    JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2011, 10 (04):
  • [44] SCANNING TUNNELLING AND ATOMIC FORCE MICROSCOPY PERFORMED WITH THE SAME PROBE IN ONE UNIT
    BRYANT, PJ
    MILLER, RG
    DEEKEN, R
    YANG, R
    ZHENG, YC
    JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 871 - 875
  • [45] Nano-oxidation of superconducting flux flow transistor using a conductive atomic force microscope tip
    Ko, S
    Kang, HG
    Lim, SH
    Han, BS
    Lee, H
    Physica Status Solidi C - Conferences and Critical Reviews, Vol 2, No 5, 2005, 2 (05): : 1702 - 1707
  • [46] Single-electron transistors (SETs) with Nb/Nb oxide system fabricated by atomic force microscope (AFM) nano-oxidation process
    Shirakashi, J
    Matsumoto, K
    Miura, N
    Konagai, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1997, 36 (9AB): : L1257 - L1260
  • [47] Atomic species identification at the (101) anatase surface by simultaneous scanning tunnelling and atomic force microscopy
    Stetsovych, Oleksandr
    Todorovic, Milica
    Shimizu, Tomoko K.
    Moreno, Cesar
    Ryan, James William
    Leon, Carmen Perez
    Sagisaka, Keisuke
    Palomares, Emilio
    Matolin, Vladimir
    Fujita, Daisuke
    Perez, Ruben
    Custance, Oscar
    NATURE COMMUNICATIONS, 2015, 6
  • [48] Atomic species identification at the (101) anatase surface by simultaneous scanning tunnelling and atomic force microscopy
    Oleksandr Stetsovych
    Milica Todorović
    Tomoko K. Shimizu
    César Moreno
    James William Ryan
    Carmen Pérez León
    Keisuke Sagisaka
    Emilio Palomares
    Vladimír Matolín
    Daisuke Fujita
    Ruben Perez
    Oscar Custance
    Nature Communications, 6
  • [49] THE INFLUENCE OF TERPENES ON HUMAN STRATUM CORNEUM BY FLUORESCENCE MICROSCOPY, ATOMIC FORCE MICROSCOPY AND SCANNING ELECTRON MICROSCOPY
    Cal, Krzysztof
    Stefanowska, Justyna
    Govedarica, Biljana
    Planinsek, Odon
    Srcic, Stane
    Bazela, Karolina
    Debowska, Renata
    ACTA POLONIAE PHARMACEUTICA, 2017, 74 (04): : 1063 - 1070
  • [50] Scanning Electron Microscopy and Atomic Force Microscopy in the study of damaged and weak hair treatment
    Tyszczuk, Bozena
    Nowakowska, Julita
    Strzelecki, Janusz
    Adamczyk, Dorota
    Debowska, Renata
    Rogiewicz, Katarzyna
    Eris, Irena
    JOURNAL OF INVESTIGATIVE DERMATOLOGY, 2010, 130 : S90 - S90