Visually servoed 3-D alignment of multiple objects with subnanometer precision

被引:12
作者
Kim, Jung H. [1 ]
Menq, Chia-Hsiang [1 ]
机构
[1] Ohio State Univ, Dept Mech Engn, Columbus, OH 43210 USA
基金
美国国家科学基金会;
关键词
image motion analysis; image registration; interferometry; motion control; visual servo control;
D O I
10.1109/TNANO.2007.914997
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a visual measurement technique and the associated visual servo control method that enable 3-D alignment of multiple objects with subnanometer precision. Such high precision is achieved through eliminating the bias error caused by spatial sampling in the in-plane motion estimation, using a highly sensitive measurement technique based on interference for the out-of-plane motion, and continuously compensating for time varying uncertainties induced by mechanical forces and thermal drifts. The developed measurement technique is integrated with a motion stage to experiment-ally demonstrate visually servoed alignment, in which two microcantilevers are aligned in the 3-D space with alignment errors below 1 nm (rms) in all axes. Nanostepping of 0.5 nm magnitude along the out-of-plane z-axis is also performed between the two microcantilevers to illustrate the super precision of the visually served 3-D alignment.
引用
收藏
页码:321 / 330
页数:10
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