CMOS technology after reaching the scale limit

被引：0
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作者：
Iwai, Hiroshi [1 ]
机构：
[1] Tokyo Inst Technol, Frontier Res Ctr, Midori Ku, Kanagawa 2268502, Japan
来源：
EXTENDED ABSTRACTS 2008 INTERNATIONAL WORKSHOP ON JUNCTION TECHNOLOGY | 2008年
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T [工业技术];
学科分类号：
08 ;
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页码：1 / 2
页数：2
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